Key words Atomic force microscopy
Springer Online Journal Archives 1860-2000
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Abstract Atomic Force Microscopy is used to determine the crystallographic polarity of the surfaces of β-AgI single crystals. The studies reveal that the hexagonal packed Ag+ plane is the (001) and the I– plane is the (001–). This observation is also consistent with the earlier x-ray diffraction measurements and chemical etching techniques as well as the polarizability and electronegativity of the ions.
Type of Medium: