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  • 1
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Solid state phenomena Vol. 1-2 (Jan. 1991), p. 1-9 
    ISSN: 1662-9779
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 1 (1982), S. 751-777 
    ISSN: 0392-6737
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto Sono stati misurati gli spettri di termoriflettanza tra 3 e 9 eV per una serie di cristalli misti GaSxSe1−x. I campioni erano lastrine monocristalline cresciute dalla fase vapore con il metodo del trasporto chimico. Le misure sono state effettuate con radiazione non polarizzata propagantesi all'incirca lungo l'asse di anisotropia dei cristalli, mentre la modulazione in temperatura è stata eseguita attorno a 65 K. Molte strutture degli spettri di riflettività sono state analizzate nella loro dipendenza dalla concentrazione di zolfo nei cristalli misti. Su questa base si è data una approfondita discussion degli spettri ottici di GaS e GaSe oltre la soglia fondamentale, e si sono ottenute nuove informazioni riguardanti i livelli elettronici di energia sia per questi composti che per l'InSe, che ha struttura cristallina analoga.
    Abstract: Резюме Были измерены спектры термоотражения в области между 3 и 9 эВ для ряда смешанных GaS x Se x−1 кристаллов. Образцы представляют монокристал-лические пластинки, вырращенные из пара химическнм методом. Измерения проведены с неполяризованным светвым пучком, распространяющимся приблизителщимся приблизительно рдоль оси анизотропии кристалла. Температура модулируется вблизи 65 К. Анализи-руются некоторы в спектрах отражения в зависимости от концентрации серы в смешанных кристаллах. Прородится подробное обсуждение оптических спектров в GaS и GaSe ниже основного края. Получается новая информадия об электронных энергетических уровнях для указанных соединений и для InSe, которые имеют аналогичную кристаллическую структуру.
    Notes: Summary The thermoreflectance spectra between 3 and 9 eV have been measured for a series of GaSxSe1−x mixed crystals. The samples were single-crystal platelets grown from the vapour by the chemical-transport method. The measurements were performed with a nonpolarized light beam propagating approximately along the anisotropy crystal axis and the temperature was modulated around 65 K. Many structures in the reflectance spectra have been analysed in their dependence on the sulphur concentration in the mixed crystals. On this basis a detailed discussion of the optical spectra in GaS and in GaSe beyond the fundamental edge is given, and new information concerning the electronic energy levels is obtained both for these compounds and for InSe, which has an analogous crystal structure.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 4 (1984), S. 141-152 
    ISSN: 0392-6737
    Keywords: Optical properties and materials
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto Sono state studiate, mediante la tecnica della termoriflettanza, le principali strutture dello spettro interbanda dei cristalli Ti1−x Hf x Se2 (0≤x≤0.3 ex=1), fra 1 e 9 eV. Si sono così ottenute nuove indicazioni circa la corrispondenza fra gli spettri interbanda del TiSe2 e dell'HfSe2. Si riportano in dettaglio e discutono i dati di termoriflettanza a valori intermedi dix con evidenza di possibili effetti di «bowing». Non sono stati osservati apprezzabili effetti della transizione di fase a 200 K ad energie superiori a 2 eV.
    Abstract: Резюме Исследуются главные особенности междузонных спектров кристаллов Ti1−xHf x Se2 (0≤x≤0.3 иx=1) с помощью техники термоотражения в области от 1 до 9 эВ. Приводятся новые данные о соответствии между междузонными спектрами TiSe2 и HfSe2. Подробно обсуждаются данные при промежуточных значенияхx. Не наблюдаются заметные эффекты фазового перехода при 200 К в TiSe2 при энергиях выше 2 эВ.
    Notes: Summary The main structures of interband spectra of Ti1−x Hf x Se2 crystals (0≤x≤0.3 andx=1) have been investigated by means of thermoreflectance from 1 to 9 eV. New indications about the correspondence of the interband spectra of TiSe2 and HfSe2 are given. Detailed data at intermediate stoichiometries, which give also evidence of possible bowing effects, are reported and discussed. No relevant effect of the 200 K phase transition in TiSe2 is observable above 2 eV.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 5 (1985), S. 292-303 
    ISSN: 0392-6737
    Keywords: Optical properties and materials
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto In questo lavoro sono riportati e discussi gli spettri di riflettanza (R) e termoriflettanza (TR) in infrarosso di campioni di silicio drogati pesantemente per diffusione con P e B. Dai dati sono ricavati i valori dei tempi di rilassamento e della massa effettiva, come pure la derivata in temperatura della frequenza di plasma, del tempo di rilassamento e della costante dielettrica ad alta frequenza, che sono analizzati sulla base delle interazioni fra portatori liberi e fononi e fra portatori liberi e impurezze.
    Notes: Summary In this work reflectance (R) and thermoreflectance (TR) spectra in the infra-red of bulk P and B heavily doped silicon samples are reported and discussed. The values of the scattering time and of the effective mass, as well as the temperature derivative of the plasma frequency, scattering time and high-frequency dielectric constant are extracted from the data and analysed in terms of free-carrier-photon and free-carrier-impurity interaction.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Physics Letters A 32 (1970), S. 415-416 
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Progress In Crystal Growth And Characterization 13 (1986), S. 97-103 
    ISSN: 0146-3535
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 3205-3213 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Differential reflectance modulation measurements in InGaAs/GaAs and GaAs/AlGaAs multiple quantum wells at room temperature are presented and discussed. In the energy range of the excitonic transitions the spectra obtained are strongly related to the first derivative of the reflectance curves. An exhaustive analysis of the line shape is carried out. It is shown how the modulation signal is related to the fluctuations of the alloy composition and of the well width. An estimate of the degree of inhomogeneity is obtained. The potential of the technique in spectral analysis and for homogeneity characterization is discussed. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 2773-2776 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Silicon samples implanted with As in the 1014–1016 cm−2 dose range and at a beam current density of 10 μA cm−2 were analyzed by reflectance and Rutherford backscattering measurements. The E1 and E2 reflectance structures disappear at a dose of 1015 cm−2 and reappear red shifted at 1016 cm−2, as a consequence of the self-annealing during high-dose-rate implantation. The red shift of E1 and E2 has been quantitatively accounted for by calculations in a multilayer damage structure. The free-carrier density determined by the infrared response correlates with the substitutional concentration of As measured by channeling effect. The optical response has been measured in laser annealed samples for comparison.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Nuclear Inst. and Methods in Physics Research, B 19-20 (1987), S. 582-584 
    ISSN: 0168-583X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Surface Science 37 (1973), S. 508-514 
    ISSN: 0039-6028
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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