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  • 1
    ISSN: 1520-5827
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1520-4995
    Source: ACS Legacy Archives
    Topics: Biology , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 95 (1991), S. 2854-2861 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: X-ray reflection (both specular and off-specular) and grazing incidence diffraction (GID) have been used to study the structure of alkylsiloxane monolayers (n-C18H37SiO1.5) formed by self-assembly from solution on silicon wafers. GID studies of complete monolayers reveal a single ring of scattering associated with the monolayer. The Lorentzian line shape of this ring indicates that the film is characterized by liquidlike order, with a typical translational correlation length of about 45 A(ring). The thermal coefficient of expansion of the monolayer, as determined from the GID peak position, is approximately equal to the value for liquid n-alkanes. Upon either heating or cooling, the monolayer correlation lengths decrease, suggesting that the differential thermal-expansion coefficients of the film and substrate figure prominently in thermal changes of the molecular ordering. GID data for incomplete monolayers also reveal a single ring of scattering associated with the monolayer. While both the translational correlation lengths and integrated peak areas are significantly reduced relative to complete monolayers, the peak positions of the incomplete monolayers are comparable to those of complete monolayers. Given the lower average areal density of incomplete monolayers, this finding implies that incomplete monolayers are inhomogeneous.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 95 (1991), S. 6628-6632 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 105 (1996), S. 3307-3315 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Relaxed Langmuir monolayers of methyl eicosanoate were studied using Brewster angle microscopy (BAM) and grazing incidence x-ray diffraction (GIXD). The structure of the various phases in this system was determined and compared to previous isotherm and microscopy measurements. At low pressure and low temperature, a crystalline phase with tilt toward nearest neighbor, I(L2″), is observed. At a temperature of ∼14 °C and low pressure there is a transition to a phase with tilt toward next-nearest neighbor, F(L2′). Finally, as the temperature continues to be raised at low pressure, there is a transition to a phase where the two F(L2′) peaks have the same values of Qxy, here called the τ phase, with a Rotator IV-like structure. At high pressure and low temperature, an untilted, orthorhombic phase, U′(CS), is observed. As the temperature is increased, a second untilted, orthorhombic phase, U(S), is observed, beginning at ∼12 °C. Above 21 °C and at high pressure, a Rotator-II-like phase is seen, with an undistorted, untilted structure. Finally, results from BAM measurements are used to monitor the texture of the film in the different phases. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 105 (1996), S. 5265-5284 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Grazing incidence x-ray scattering (GIXS) and Brewster angle microscopy (BAM) are used to determine the π–T phase diagram of Behenic acid monolayers supported on the surface of water (pH=2.0) over the temperature range of 3 °C to 20.6 °C. The phase diagram is constructed from measurements taken during isothermal compressions in which the surface pressure relaxed to a stable value at each surface density, and during temperature scans at fixed average surface density. The phase diagram is different than those previously reported for Behenic acid primarily because of the surface pressure relaxation. For temperatures less than 12 °C the phase diagram exhibits similar phases and topology as the published diagrams, although the location of the phases in the π–T plane is different. Temperature scans combined with the isotherms, and the Clausius–Clapeyron relation are used to determine three coexistence lines that meet in a triple point. Changes in entropy across the phase boundaries are determined. Near room temperature (20.6 °C) only one phase is measured over the range of surface pressure from 0 dynes/cm to the collapse pressure in contrast to reported measurements on monolayers out of equilibrium (i.e., when the surface pressure is not allowed to relax) that exhibit several phases near room temperature at pressures higher than the collapse pressure. Discrepancies are observed between the average area per molecule (AT) and the area per molecule determined from measurements of the unit cell (AX) in the close packed regions of the phase diagram. It is conjectured that the π–AX plane is a better representation of the ordered equilibrium monolayer phases than the π–AT plane. Isotherms plotted in the π–AX plane are used to determine the compressibility of the ordered phases and the nature of the phase transitions. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 96 (1992), S. 2356-2370 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The structure of the fully relaxed phases of a Langmuir monolayer of tetracosanoic acid is determined by x-ray diffraction and reflection along an isotherm at ∼20.5 °C. Isotherms taken by allowing the surface pressure to stabilize between incremental compressions are seen to be qualitatively different from the constant-rate nonrelaxed isotherms typically seen in the literature. At low densities the monolayer consists of an inhomogeneous film of islands of a crystalline (or hexatic) phase with molecular tilt ordering that is analogous to that of the smectic I liquid crystal. Small amounts of impurities (∼0.5% of the monolayer) account for the change in surface pressure with area in this region. Upon compression to the point that the free space between islands becomes negligible the film appears homogeneous. On further compression the time required for full relaxation becomes long (i.e., ∼ hours), the tilt angle of the molecular axis decreases and the x-ray unit cell is compressed. Including this homogeneous I phase the phase sequence observed by diffraction upon compression is I-U-I-U, where U refers to an untilted orthorhombic phase. The outer two phases of this sequence are pure phases which form homogeneous monolayers, but the inner two are inhomogeneous phases each coexisting with an amorphous phase that does not have an observable diffraction signal. At the boundaries demarcating the I and U phases, a phase whose tilt ordering is analogous to that of a smectic F phase is seen to coexist. The preceding phase sequence is sensitive to the degree of relaxation permitted the monolayer after an incremental compression. In particular, if the monolayer is not allowed to relax completely after each compression, the untilted U phase may never appear. The U↔I transition is shown to be reversible for a relaxed monolayer.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 98 (1993), S. 1754-1754 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 2554-2559 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An x-ray diffractometer for studying the structure of the liquid–vapor interface is described. It is designed to permit reflectivity and scattering studies from liquid surfaces for angles varying from grazing incidence, below the critical angle for total external reflection up to angles ∼3° using a rotating anode x-ray generator. In principle the diffractometer system can be used to study both the density profile normal to the surface and in-plane structural features. The former is determined by deviations of the measured reflectivity from the Fresnel law of classical optics and the latter from nonspecular scattering. Results obtained using this spectrometer to measure the density profile normal to the surface of water and a liquid crystal are presented.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 3422-3424 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray reflectivity has been utilized in a study of the SiO2/Si interfacial structure for dry oxides grown at room temperature on highly ordered Si(001) surfaces. Scattering near (±110) demonstrates the Si lattice termination of the wafers studied is characterized by a highly ordered array of terraces separated by monoatomic steps. Specular reflectivity data indicate the "native'' dry oxide thickness is approximately 5 A(ring) with a 1-A(ring) vacuum interface width. Residual laminar order in the oxide electron density along the oxide/Si interfacial normal decays exponentially from the oxide/Si interface with a ∼2.7-A(ring) decay length.
    Type of Medium: Electronic Resource
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