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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 4605-4609 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray emission spectroscopy with high-energy resolution was used for characterizing differences in the valence band of carbon films deposited by ion implantation in various conditions of bombardment and with various substrates, with respect to crystalline diamond and other diamondlike coatings. The obtained results were compared with calculations of the partial density of 2p states in defected diamond, and the nature of point defects in the implanted films could be identified. In addition, x-ray emission spectra of substrate atoms indicated a chemical interaction at some interfaces.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 239-245 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recent experiments have identified the microstructure of amorphic diamond with a model of packed nodules of amorphous diamond expected theoretically. However, this success has left in doubt the relationship of amorphic diamond to other noncrystalline forms of carbon. This work reports the comparative examinations of the microstructures of samples of amorphic diamond, i-C, and amorphous carbon. Four distinct morphologies were found that correlated closely with the energy densities used in preparing the different materials.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 3260-3265 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Films of amorphic diamond can be deposited from laser plasma ions without the use of catalysts such as hydrogen or fluorine. Prepared without columnar patterns of growth, the layers of this material have been reported to have "bulk'' values of mechanical properties that have suggested their usage as protective coatings for metals. Described here is a study of the bonding and properties realized in one such example, the deposition of amorphic diamond on titanium. Measurements with Rutherford backscattering spectrometry and transmission electron microscopy showed that the diamond coatings deposited from laser plasmas were chemically bonded to Ti substrates in 100–200-A(ring)-thick interfacial layers containing some crystalline precipitates of TiC. Resistance to wear was estimated with a modified sand blaster and in all cases the coating was worn away without any rupture or deterioration of the bonding layer. Such wear was greatly reduced and lifetimes of the coated samples were increased by a factor of better than 300 with only 2.7 μm of amorphic diamond.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 2657-2659 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Amorphous carbon films were deposited onto Si, SiC, and Ti alloys by implanting low-energy C+ ions, laser ablation, or double ion beam sputtering (DIBS). Their soft x-ray emission spectra were recorded by means of an electron probe microanalyzer (EPMA). Comparison of the energy position of peaks with characteristic spectra of various standards has shown that the short range order in films formed by 2 keV C+ implantation or laser ablation was about the same as in diamond. On the contrary, DIBS films and implantation films formed at lower energies were rather graphite-like. The former were constituted of true diamond-like carbon, since other analysis indicated that they were free of H and O contamination and that a carbide of the substrate species did not grow. It is concluded that EPMA is a valuable method for characterizing the bonding in carbon films.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 197-205 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An experimental set up for X-ray diffraction experiments at grazing incidence is described. Adjustment and calibration procedures are defined. It allows identification of phases at increasing depth in thin films, with a resolution of 50 nm, by varying the incidence angle above the critical angle of specular reflection. Some examples are given to illustrate the potential of the technique in studies of the effects of surface treatments on bulk specimens. The examples are implantation films with thicknesses between 50 and 500 nm, and also rough films resulting from friction tests of these implanted surfaces.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 20 (1985), S. 1480-1493 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The wear and friction resistance of nickel surfaces implanted with increasing doses of boron or phosphorous was investigated, with a pin-on-disc geometry and a 100C6 steel rider, in air. The seizure resistance is drastically improved when the implanted dose is sufficiently high to give an amorphous Ni-B or Ni-P layer.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 32 (1997), S. 6163-6173 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Changes of composition and structure of various types of polysiloxanes and polycarbosilanes when submitted to irradiation with ions of increasing mass, were analysed by means of several ion-beam analytical techniques, Raman and Fourier transform–infrared spectroscopies. Ion irradiations is as efficient as annealing at temperatures above 1000°C for releasing hydrogen from these organic–inorganic polymers, and the radiolytic evolution of hydrogen is selective, whereas methane, silanes and carbon monoxide are also evolved during heat treatments. The kinetics of the polymer conversion into amorphous ceramics depends strongly on the linear density of energy transferred by ions to electron shells of target atoms, according to the ion energy per nucleon and to the nature of the side groups. Some of the carbon atoms segregate in clusters exhibiting a diamond-like hybridization state, in contrast to the clusters of turbostratic graphite formed in pyrolysed films.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract. Ion irradiation or heat treatments in vacuum of gel films prepared from mixtures of triethoxysilane with Fe and Ni nitrates permits to obtain a precipitation of metal particles in a glassy matrix, because these gels contain hydrido groups able to reduce Fe3 + and Ni2 + ions. The precipitation under irradiation is ascribed to the electronic excitations produced by the ions and the volume of metallic phase increases in proportion to the amount of energy transferred to electrons. The metal particles exhibit a narrower range of sizes than in films submitted to heat treatments in vacuum. Experiments of electron spin resonance indicate that the magnetic behavior of irradiated films is affected by a stress-induced anisotropy field. Films containing 3 to 7 at% Fe are in a superparamagnetic state in a given range of temperatures while the magnetic moments of nickel particles in films with similar metal contents exhibit a stronger correlation, due to a larger yield of precipitation and to the stress.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 32 (1997), S. 6175-6182 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The hardnesses of polycarbosilane and polysiloxane coatings subjected to irradiation with increasing doses of He, C and Au ions were measured by means of nanoindentation tests. Diamond-like carbon clusters which are formed during irradiation enhance the hardnesses of the ceramic films which reach in some cases three times that of conventionally annealed specimens. When submitting irradiated films to an additional anneal, the clusters resulting from the segregation of atoms from methyl groups remain more diamond like than those formed directly by radiolysis of phenyl rings, especially when the radiolytic transformation is incomplete (the film having received a low irradiation dose). Moreover, owing to the selective release of hydrogen and the recombination of free radicals at room temperature, no evolution of CHx and COx nor oxidation of unpaired Si atoms occurs during this post-irradiation anneal, contrary to the observations during direct thermal conversion.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 22 (1987), S. 1087-1096 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Several spectroscopies analysing the composition and chemical nature of thin films (Rutherford backscattering spectrometry, nuclear reaction analysis, secondary ion mass spectroscopy, X-ray photoelectron spectroscopy) were combined with a specially designed technique of X-ray diffraction at grazing incidence on bulk samples, in order to characterize Ti1−x N x films of nearly homogeneous composition obtained by ion implantation at several energies. Differences in the nature of the phases observed, with respect to previous TEM studies on thin foils, are discussed in terms of radiation-enhanced diffusion and of thermal dissipation of the ion-beam power. The distribution of nitrogen atoms, defects and phases as a function of the nitrogen concentration are also correlated with changes in depth profiles of hardness measured by a submicroscopic indentation test.
    Type of Medium: Electronic Resource
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