ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Czochralski grown silicon annealed at 750° C has been investigated with high-resolution electron microscopy, Hall effect and infrared measurement. Crystalline plate-like precipitates were observed and identified asβ-cristobalite. The structure of the coherent interface of the new phase and its connection with the origin of the new donor are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF02385742
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