Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
59 (1986), S. 3318-3327
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Near-field optical-scanning (NFOS) microscopy or "optical stethoscopy'' provides images with resolution in the 20-nm range, i.e., a very small fraction of an optical wavelength. Scan images of metal films with fine structures presented in this paper convincingly demonstrate this resolution capability. Design of an NFOS microscope with tunnel distance regulation, its theoretical background, application potential, and limitations are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.336848
Permalink
Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |