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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 39-44 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a method to calculate the electrostatic field between a metallic tip of arbitrary shape and a sample surface. The basic idea is to replace the electrodes by a set of "image'' charges. These charges are adjusted in order to fit the boundary conditions on the surfaces. As an application of the method, we describe the field characteristics of a field-emission diode as a function of the gap between electrodes for different tip shapes. A comparison between numerical and analytical results is presented. The results do not depend on the overall tip geometry only for gap distances smaller than ≈1/2 the tip radius. The field enhancement factor due to the presence of small protrusions on the tip apex is calculated and their influence in near-field-emission scanning tunneling microscopy is also discussed. We show that the electron-field emission from the sample is stable against tip-shape changes due to adsorbate diffusion or atomic rearrangements. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 4293-4295 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a new way to observe the surface domain distribution of a magnetic sample at a submicrometer scale. This magnetic microscopy is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). We study the magnetic forces involved in the interaction between a single-domain microtip and the sample surface magnetic domains. The influence of the experimental conditions on the performance of the AFM as a magnetic profiling device is also discussed. Preliminary experimental results are reported.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 2947-2947 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recently, we have proposed1 a new method to obtain information about local surface magnetic properties, based on the idea of measuring magnetic forces with an STM force microscope.2 In this work, we present a theoretical analysis of the magnetic topography as despicted by this magnetic force microscope (MFM). In order to study the resolution and practical limits of this new technique, we simulate MFM results for different magnetic configurations. The influence of surface roughness on the magnetic resolution is also discussed. We show that lateral resolutions of 0.01 μm can be achieved with this technique. Recent MFM experiments are also analyzed.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 2955-2957 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A theoretical approach to electrostatic scanning probe microscopy is presented. We show that a simple perturbation formula, originally derived in the context of scattering theory of electromagnetic waves, can be used to obtain the capacitance and the electrostatic force between a metallic tip and an inhomogeneous dielectric sample. For inhomogeneous thin dielectric films, the scanning probe signal is shown to be proportional to the convolution between an effective surface profile and a response function of the microscope. This provides a rigorous framework to address the resolution issue and the inverse problem. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 4048-4050 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A detailed analysis of electrostatic interactions between a dc-biased tip and a metallic or insulating sample is presented. By using a simple method to calculate capacitances and forces, tip shape effects on the force versus tip-sample distance curves are dicussed in detail. For metallic samples the force law, except for a constant background, only depends on the tip radius of curvature. In contrast, for dielectric samples the forces depend on the overall geometry of the tip. Interestingly, we found that the contact (adhesion) force does not depend on the tip size and is bound by a simple expression which only depends on the applied bias and the sample dielectric constant.© 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 1912-1914 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Exact calculations of the transmittance of surface corrugated optical waveguides are presented. The elastic scattering of diffuse light or other electromagnetic waves from a rough surface induces a diffusive transport along the waveguide axis. As the length of the corrugated part of the waveguide increases, a transition from the diffusive to the localized regime is observed. This involves an analogy with electron conduction in nanowires, and hence, a concept analogous to that of "resistance" can be introduced. We show an oscillatory behavior of both the elastic mean-free path and the localization length versus the wavelength. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 53 (1988), S. 1449-1451 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new method to obtain information about local surface magnetic properties has been proposed recently. This new technique is based on the idea of measuring magnetic forces with a scanning tunneling force microscope. In this work we present a theoretical analysis of the relevant forces involved in magnetic force microscopy. Recent experiments with high-resolution images of laser-written domains in a magnetic thin film are discussed.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 1169-1171 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a generalized image–charge method to calculate the interaction energies of a charge placed between a metallic tip of arbitrary shape and a sample surface. The basic idea is to replace the electrodes by a set of image charges. These charges are adjusted in order to fit the boundary conditions on the surfaces. As an application of the technique, we have calculated the three-dimensional potential barrier (including image interaction) for electron field emission from sharp tips having different geometries. The influence of the presence of a little hemispherical bump on the apex is also discussed. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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