American Institute of Physics (AIP)
Journal of Applied Physics
86 (1999), S. 3885-3889
AIP Digital Archive
Five layered Sr2Bi4Ti5O18 has been prepared in the ceramic form with a view to studying its electrical properties. X-ray and microstructural studies were employed for physical characterization. Detailed electrical property measurements were undertaken so as to understand the basic transport physics of this compound. The results of dielectric studies, dc conductivity, and ac impedance are discussed, and a defect formula for Sr2Bi4Ti5O18 has been proposed. The investigations on this material at high temperatures and frequencies reveal its stable behavior. © 1999 American Institute of Physics.
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