ISSN:
1573-482X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The magnetic state of Fe atoms at or near the interface between Fe74.3Al9.8Si15.9 sendust magnetic thin films and SiO2-based crystallized glass substrate (Fotoceram, Corning Co.) has been examined using conversion electron Mössbauer spectroscopy. The thicknesses of sputtered films are 0.05–2.0 Μm, and annealing conditions are at 500
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00225631
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