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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of chemical & engineering data 17 (1972), S. 168-174 
    ISSN: 1520-5134
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 11 (1976), S. 265-272 
    ISSN: 1432-0630
    Keywords: 79.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The reflection of light ions from heavy random targets has been calculated within the single-collision approximation on the basis of essentially the same physical model as Schiøtt's adaptation of the LSS range theory to light ions. An accurate effectivepower approximation has been utilized to evaluate a number of physical quantities relating to reflected ions under the assumption of Thomas-Fermi scattering. Analytical results as well as universal curves are presented for reflected-energy spectra integrated over ejection angle, particle and energy reflection coefficients, and quantities derived from these. Good agreement with experimental results is obtained for ε≳, where ε is Lindhard's energy parameter. The results are compared with those from previous calculations on the basis of transport theory and computer simulation. An estimate is given of the single-collision tail of the light-ion range profile. Qualitative corrections for beam attenuation and recoil energy loss are presented in appendices.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 33 (1984), S. 141-152 
    ISSN: 1432-0630
    Keywords: 44.90+c ; 61.80.Jh ; 79.20.Nc ; 96.60.Vg
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The temperature dependence of the sputter yield and the energy spectrum of sputtered atoms have been investigated on the basis of a standard model for thermal spikes. A high-temperature and a low-temperature regime have been identified in the temperature spectrum making up the evaporation yield. The high-temperature component of the yield as well as the associated energy spectrum are only very weakly dependent on ambient target temperature. The relative variation is the less pronounced the higher the spike temperature. The low-temperature component is associated with the long-time behavior of the spike, and measurable evaporation takes place over time intervals where spikes overlap. The importance of time constants for macroscopic heat transport is pointed out. The results are shown to provide a framework within which experimental results on the temperature dependence of the sputter yield of metals can be explained. The results are also consistent with measured temperature dependences in the sputter yield of insulators.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 35 (1984), S. 19-25 
    ISSN: 1432-0630
    Keywords: 44.30+v ; 61.80 Jh ; 79.20 Nc ; 96.60 Vg
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract We have investigated the effect of heat loss through evaporation on the surface temperature profile and the evaporation yield of an ion-induced spike. We derive a three-dimensional extension of a nonlinear integral equation first found by Mann and Wolf to describe the temperature profile in a semiinfinite medium in the presence of heat loss through the surface. The equation has been solved by perturbation expansion in powers of the evaporation rate. For heavy-ion induced, cylindrical elastic-collision spikes, noticeable but moderate corrections are found to evaporation yields estimated previously by neglecting heat loss due to evaporation. These results are relevant mainly to sputtering of metals by heavy atomic and molecular ion bombardment. Comments are also made on sputting of insulators both by heavy keV ions and by ionizing particles. Expressions for an effective sputter time and sputter area are derived for cylindrical geometry; both quantities turn out independent of the initial spike temperature. The sputter radius is normally greater than the depth of the crater formed; we conclude that the influence of crater formation on the evaporation yield is normally negligible.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 25 (1981), S. 307-310 
    ISSN: 1432-0630
    Keywords: 79.20 ; 68.55 ; 61.80 ; 34
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Estimates are given for the distribution of the depth of origin of sputtered atoms in the low-fluence limit, as well as the corresponding distribution of atoms sputtered into a given energy interval. The former distribution is well described by an exponential profile, with the characteristic depth being consistent with previous results. The latter distribution is characterized by an energy-dependent depth scale and a shape that varies from exponential at low sputtered-atom energies to inverse-power form at higher energies.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Physics Letters A 24 (1967), S. 104-105 
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Annals of Physics 201 (1990), S. 152-192 
    ISSN: 0003-4916
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Physics Letters A 15 (1965), S. 237-238 
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 88 (1984), S. 680-682 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 1993-1995 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: It is demonstrated explicitly that the collective-current concept in atomic mixing, as formulated by Collins, is equivalent with the homogeneous-relaxation model proposed by Hofer and Littmark. Both schemes lead to the balance equation of Sigmund, Oliva, and Falcone. The relation to Titov's model of high-fluence ion implantation is clarified.
    Type of Medium: Electronic Resource
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