ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Although the types of ion sources in many applications are of great diversity the quality of a source can be assessed mostly by the measurement of the same beam parameters. In this paper the characteristics of various devices for measurement of beam currents, beam profiles, and transverse emittances are discussed. Special reference is given to the limitations arising from thermal heating in case of very intense beams. On the other hand, the detection limits given by electrical noise in case of very low currents are considered.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142869
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