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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 785-787 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ordering of Cu and In atoms in near-stoichiometric CuInS2 epitaxial films grown on Si (111) by molecular beam epitaxy was studied by transmission electron microscopy. Nonchalcopyrite ordering of the metal atoms in CuInS2 is observed, which is identified as CuAu-type ordering. Sharp spots in electron diffraction patterns reveal the ordered Cu and In atom planes alternating along the [001] direction over a long range. High-resolution electron microscopy confirms this ordering. The CuAu-ordered structure coexists with the chalcopyrite ordered structure, in agreement with theoretical prediction. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 2483-2485 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ordering of metal atoms in CuInS2 and CuGaSe2 thin films grown by vapor-phase epitaxy on Si (001) and GaAs (001) substrates were studied using transmission electron microscopy and first-principles total energy calculations. Chalcopyrite and CuAu-like orderings of the metal atoms were observed coexisting in CuInS2 films, while only chalcopyrite ordering was found in CuGaSe2 films. First-principles total energy calculations find that the formation enthalpy difference between chalcopyrite and CuAu-like phases of CuInS2 is very small (2 meV/atom), while it is large for CuGaSe2 (9 meV/atom), indicating that the existence of CuAu-like phase in the nominally chalcopyrite semiconductors is controlled by bulk thermodynamics. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Ultramicroscopy 28 (1989), S. 47-48 
    ISSN: 0304-3991
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
    Type of Medium: Electronic Resource
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