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  • 1
    Electronic Resource
    Electronic Resource
    Low-energy diffuse scattering electron-spin polarization analyzer (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 1314-1323 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new, compact (approximately fist sized), efficient electron-spin analyzer is described. It is based on low-energy (150 eV) diffuse scattering from a high-Z target, for example, an evaporated polycrystalline Au film opaque to the incident electron beam. By collecting a large solid angle of scattered electrons, a figure of merit S2I/I0=10−4 is achieved with an analyzing power S=0.11. The figure of merit degrades only marginally (〈10%) for beams with an energy width of 40 eV or after one month of operation at 10−8 Torr. The electron optical acceptance is of order 100 mm2 sr eV. The details of the design and construction are discussed and its performance is compared to six other spin analyzers. Illustrative results are presented from an application to scanning electron microscopy with polarization analysis (SEMPA) to image magnetic microstructure.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138595
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  • 2
    Electronic Resource
    Electronic Resource
    Improved low-energy diffuse scattering electron-spin polarization analyzer (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 1-11 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An improved low-energy diffuse scattering electron-spin polarization analyzer is described. It is based on the low-energy (150 eV) diffuse scattering of polarized electrons from polycrystalline evaporated Au targets. By collecting large solid angles and efficiently energy filtering the scattered electrons, a maximum figure of merit, FOM=S2I/I0=2.3×10−4 is achieved. Maximum measured values of the Sherman function were S=0.15. Further, the instrumental (false) asymmetry due to changes in the trajectory of the incident electron beam has been minimized by balancing the angular and displacement asymmetries. A total residual scan asymmetry as low as 0.0035/mm has been measured over 4-mm scan fields at the Au target in the detector. This instrumental asymmetry would produce a maximum error in the polarization in a SEMPA experiment of less than 0.3% for a 100-μm full-field scan. Details of the design and performance of the new detector are given.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140575
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  • 3
    Electronic Resource
    Electronic Resource
    Magnetic microstructure of the (0001) surface of hcp cobalt (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2553-2555 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic domain structure of the (0001) surface of a hcp cobalt crystal was investigated using scanning electron microscopy with polarization analysis (SEMPA). This is the first observation by SEMPA of both out-of-plane and in-plane magnetization components. The perpendicular magnetization imaged with SEMPA showed a branched structure very similar to that previously observed by magneto-optic Kerr microscopy. In addition, a previously unobserved in-plane magnetic substructure was measured. The in-plane magnetization is divided into well-defined submicron domains that appear to reflect the sixfold symmetry of the crystal surface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101979
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  • 4
    Electronic Resource
    Electronic Resource
    Magnetic moments in Cr thin films on Fe(100) : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6201-6203 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetism at the surface of a Cr film grown epitaxially on a Fe(100) whisker is observed as a function of Cr thickness by scanning electron microscopy with polarization analysis. Use of a wedge-shaped film of linearly increasing thickness allows the magnetism to be followed continuously for 75 Cr layers. Over the temperature range measured from just below the Néel temperature of bulk Cr, TN, to 1.8 TN, the surface magnetic moment is seen to persist and change direction with each additional Cr layer, but there are phase slips in this antiferromagnetic ordering. These are consistent with an incommensurate spin density wave (SDW) in the Cr film having a wavelength of 40 layers at TN. An irregularity in the antiferromagnetic stacking order in the first four layers is discussed and the behavior of the moments at the subsequent phase slip is examined. The limitations which prevent the determination of the surface magnetic moment from the spin polarization of secondary electrons are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352697
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  • 5
    Electronic Resource
    Electronic Resource
    Domain images of ultrathin Fe films on Ag(100) (1988)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 1918-1920 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning electron microscopy with electron polarization analysis has been used to image domains of ultrathin Fe films grown epitaxially on a Ag(100) substrate. Room-temperature measurements show clearly the existence of large domains of in-plane magnetization for film thicknesses of 3.4 monolayers or more. No in-plane domains were observed for thinner films.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.99616
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  • 6
    Electronic Resource
    Electronic Resource
    Oscillatory exchange coupling in Fe/Au/Fe(100) : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 6437-6439 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning electron microscopy with polarization analysis was used to investigate the interlayer exchange coupling in Fe/Au/Fe(100) sandwich structures. The films were epitaxially grown on single-crystal Fe(100) substrates. Electron diffraction measurements revealed that the Au spacer film grew with a surface reconstruction consistent with that observed for bulk Au crystals. The exchange coupling oscillates between primarily ferromagnetic and antiferromagnetic coupling for Au spacer layers up to 65 layers (13 nm) thick, but a significant biquadratic coupling component was also observed. The oscillatory coupling exhibited two components with periods of 2.48±0.05 layers (0.506±0.010 nm) and 8.6±0.3 layers (1.75±0.06 nm). The measured periods are in excellent agreement with those calculated from spanning vectors of the Au Fermi surface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356954
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  • 7
    Electronic Resource
    Electronic Resource
    Hot electron spin-valve effect in coupled magnetic layers : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 6452-6454 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: SEMPA observations of magnetic exchange coupling in the Fe/Ag/Fe, Fe/Au/Fe, and Fe/Cr/Fe systems reveal an intensity variation in the emitted secondary electron signal that depends only on whether the Fe layers are coupled in a ferromagnetic or antiferromagnetic sense. We ascribe this new effect to spin dependence in the transport of electrons between the two magnetic layers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356959
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  • 8
    Electronic Resource
    Electronic Resource
    Influence of Cr growth on exchange coupling in Fe/Cr/Fe(100) (invited) (abstract) : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6992-6992 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The giant magnetoresistance and the interlayer exchange coupling between magnetic layers separated by nonmagnetic spacer layers are sensitive to the roughness at the interfaces in multilayer magnetic structures. We present scanning tunneling microscopy (STM) measurements of the thickness fluctuations in Cr films grown at different temperatures on near-perfectly flat Fe(100) whiskers and correlate these results with our scanning electron microscopy with polarization analysis (SEMPA) measurements of the oscillations of the exchange coupling in Fe/Cr/Fe(100) structures grown at similar temperatures. Layer-by-layer growth was observed by STM for Cr deposition on an Fe substrate at deposition temperatures greater than 300 °C. The SEMPA measurements of the Fe overlayer magnetization as a function of Cr spacer layer thickness for Cr growth at this temperature could be simulated well by oscillatory coupling with periods 2.105±0.005d and 12±1d, where d is the layer spacing. Rougher Cr growth, limited by diffusion kinetics, is observed at lower temperatures, giving a distribution of thicknesses in the growth front. We modeled the Fe magnetization for lower temperature Cr growth by assuming that the exchange coupling at each discrete Cr thickness is the same as found for layer-by-layer growth. The total coupling at each average Cr spacer layer thickness was determined by adding the weighted contribution to the coupling from each Cr layer thickness contributing to the average thickness. Very good agreement was obtained with the SEMPA measurement of the Fe overlayer magnetization for Cr growth at lower temperatures without including other consequences of roughness at the interface, such as the breakdown of translational invariance.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358065
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  • 9
    Electronic Resource
    Electronic Resource
    Biquadratic exchange coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) thin film sandwiches (abstract) : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 5984-5984 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the magnetic exchange coupling between an Fe film and an Fe(100) single crystal whisker substrate separated by varying thickness Cr or Ag spacer layers. The magnetization of the Fe was measured using scanning electron microscopy with polarization analysis. Reflection high-energy electron diffraction and scanning tunneling microscopy (STM) were used to analyze the film structure. In addition to the oscillatory thickness-dependent bilinear exchange coupling, biquadratic exchange coupling was observed in both films. At spacer thicknesses that correspond to the transitions between ferromagnetic and antiferromagnetic coupling the Fe film magnetization was in-plane and orthogonal to the ferromagnetic alignment. Our observations generally agree with the model proposed by Slonczewski1 in which the biquadratic coupling originates from the bilinear coupling through spatial fluctuations of the spacer thickness. If these fluctuations occur over small enough length scales and the bilinear coupling varies between ferromagnetic and antiferromagnetic with monolayer thickness changes, then the Fe film intralayer exchange stiffness forces biquadratic coupling of the film to the substrate. We have observed the necessary short-period coupling in both Fe/Cr/Fe and Fe/Ag/Fe and we have measured the length scale of the thickness variations on a similar sample using a STM. One unexpected result in Fe/Ag/Fe was that the amount of biquadratic coupling increased with increasing top Fe layer thickness. No similar dependence was observed for Fe/Cr/Fe.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353491
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  • 10
    Electronic Resource
    Electronic Resource
    Magnetic-field-modulated written bits in TbFeCo thin films: Transmission electron microscopy Lorentz and scanning electron microscopy with polarization analysis studies (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 4710-4718 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Domains written thermomagnetically in TbFeCo thin films are studied with Lorentz transmission electron microscopy (TEM) and scanning electron microscopy with polarization analysis (SEMPA). Four different rare-earth/transition-metal compositions TbxFeyCo1−x−y are examined. The domain structures observed with both techniques are similar even though TEM Lorentz only detects the transverse component of the net magnetic field along the electron's trajectory through the sample, while SEMPA detects the surface electron-spin polarization (magnetization). We find that the magnetic contrast in the SEMPA measurements is proportional to the magnetization of the transition-metal (TM) subnetwork which is antiferromagnetically coupled to the rare-earth (RE) subnetwork. This allows high-contrast SEMPA images to be acquired even when the system is magnetically compensated (Ms=||MRE−MTM||=0). The surface magnetization can be explained by assuming that the surface of the TbFeCo alloy consists of an outermost thin oxide layer followed by an Fe-rich subsurface layer. The importance of the demagnetizing field on the switching and domain nucleation process for thermomagnetically written bits is examined.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346151
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