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  • 1
    Electronic Resource
    Electronic Resource
    Spectroscopy in the extreme ultraviolet on an electron beam ion trap : Proceedings of the 12th topical conference on high temperature plasma diagnostics (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 276-279 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A compact grazing-incidence spectrometer was implemented on the Livermore electron beam ion trap facility for spectral measurements in the extreme ultraviolet spectral region. The spectrometer employed a 1200 l/mm grating designed for flat-field focusing and a charge coupled device camera for readout. The instrument was used to measure line emission in the range from 25 to 220 Å with a resolving power as high as 600. The performance and calibration of the instrument is described and spectra from highly charged nitrogen and iron ions are presented. Measurements of the K-shell spectrum of He-like N5+ are presented that confirm earlier wavelength determinations and illustrate the accuracy achievable with the instrument. Our measurement suggests a change in the line identifications of the forbidden He-like N5+ transition 1s2s 3S1→1s2 1S0 and of the Li-like N4+ collisional satellite transition 1s2s2p 2P3/2→1s22s 2S1/2 observed on the Alcator C-Mod tokamak. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149324
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  • 2
    Electronic Resource
    Electronic Resource
    Grazing-incidence measurements of L-shell line emission from highly charged Fe in the soft x-ray region : Proceedings of the 12th topical conference on high temperature plasma diagnostics (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 284-287 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Line emission from highly charged ions in the soft x-ray region represents an important diagnostic for high-temperature plasmas. The wavelength region of 10–30 Å is occupied by lines from the K-shell transitions in N through Ne and L-shell transitions in Ti through Ni. Crystal spectrometers have previously been used to investigate Fe line radiation under well controlled conditions using the LLNL electron beam ion trap facility in this wavelength region. To complement this work we have instituted a grazing-incidence spectrometer with a variable line-spaced, concave grating and a flat field of focus which is suited for a multichannel detector. Simultaneous observations of the Ne-like Fe16+ n=3→2 transitions were made with this instrument and a flat-crystal spectrometer in order to establish the linear polarization of the Fe XVII lines. We present a description of the grating spectrometer and discuss its performance in comparison with Rowland circle based grazing incidence instruments. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149511
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Implementation of a normal incidence spectrometer on an electron beam ion trap : Proceedings of the 12th topical conference on high temperature plasma diagnostics (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 288-291 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Spectroscopic instrumentation is one of the keys to the exploration of high-temperature plasmas. The electron beam ion trap (EBIT) can serve as a tool for precise studies of highly charged ions in the laboratory and can help in setting spectroscopic standards for plasma studies. Recent efforts have focused on investigating the EUV, vacuum ultraviolet (VUV), and UV regimes. We present here the implementation of a 1 m normal incidence spectrometer for use on the Lawrence Livermore National Laboratory high-energy EBIT (Super-EBIT) for spectral analysis of line emission of highly charged ions. Using two different gratings, our study encompasses a wide range of wavelengths spanning the VUV through the visible. Examples of measurements of optical spectra from krypton and argon are given. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149325
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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