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  • 1
    Electronic Resource
    Electronic Resource
    Gradient Interface Layers to Improve c-BN Thin Film Adhesion (1998)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 287-288 (Aug. 1998), p. 259-262 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/03/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.287-288.259.pdf
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  • 2
    Electronic Resource
    Electronic Resource
    Transmission electron microscopy and reflected high-energy electron-diffraction investigation of plastic relaxation in doped and undoped ZnSe/GaAs(001) (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4124-4131 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report on reflected high-energy electron-diffraction and transmission electron microscopy plane-view investigation of the dislocation structure in doped and undoped ZnSe/GaAs(001) grown by molecular-beam epitaxy and metal-organic vapor-phase epitaxy. The thicknesses of the investigated layers vary between 60 and 900 nm. Several stages of dislocation formation are found which occur at distinct layer thicknesses. Frank partial dislocations (up to 500 nm), Shockley partial dislocations (between 130 and 400 nm) with a maximum density at 300 nm, and perfect 60° dislocations (above 300 nm) are observed in samples with perfectly smooth surface. The formation of Shockley partial dislocations is strongly anisotropic which might be due to the higher mobility of α-type dislocations. An increased roughness of the growing surface yields a suppression of Shockley partial dislocations and an irregular dislocation network with dislocations inclined to the 〈110〉 directions. A regular dislocation network with straight dislocations is found in Cl-doped samples. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361776
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  • 3
    Electronic Resource
    Electronic Resource
    Investigation of the micromagnetic structure of cross-tie walls in permalloy (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 2447-2452 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The modified differential phase contrast (MDPC) mode of Lorentz electron microscopy was used to study the micromagnetic structure of cross-tie walls in permalloy. The distribution of magnetic induction along these walls is characterized and studied in detail by vector mappings calculated from MDPC image pairs. The wall thickness of the cross-tie wall is determined by fitting the calculated image signal of an analytical function to the MDPC wall profiles. A pronounced dip in the wall width is found at the center of the vortex structure of the cross-tie wall. The results are compared to theoretical calculations by Nakatani, Uesaka, and Hayashi, Jpn. J. Appl. Phys. 28, 2485 (1989).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353102
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  • 4
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy on rough surfaces: Tip-shape-limited resolution (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 1156-1159 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper discusses the reliability of scanning tunneling microscopy (STM) images of mesoscopically rough surfaces. The specific structure of these images represents a convolution between the real surface topography and the shape of the tip. In order to interpret these images quantitatively, the line scans of steep and high steps can be used to obtain an image of the tip itself. This image shows tip radii ranging typically from 5 to 15 nm and cone angles of about 30° over a length of 80 nm, and can in turn be used to recognize the limits of STM resolution on a rough surface: High-resolution transmission electron microscopy cross-section images of Au island films on a Au-Nb double layer are convoluted with the experimentally observed tip shape; the resulting line scans correspond very well with STM graphs of the same samples. Finally an overall criterion for the resolution of the STM on such surfaces is proposed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345712
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  • 5
    Electronic Resource
    Electronic Resource
    Magnetization pattern of ferromagnetic nanodisks (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 4437-4439 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We explore the magnetization pattern of Co and permalloy disks with diameters between 80 nm and 1 μm by using two complementary experimental techniques: Lorentz microscopy and magnetic force microscopy (MFM). By means of Lorentz microscopy we show that the dominating magnetization pattern of the disks is a vortex structure with closed flux lines in the plane of the disks. Complementary MFM measurements demonstrate that the magnetization in the center of the disks is tilted out of the plane of the disk. The experimental findings closely agree with corresponding micromagnetic calculations. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1289216
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  • 6
    Electronic Resource
    Electronic Resource
    Stability of magnetic vortices in flat submicron permalloy cylinders (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 92 (2002), S. 1466-1472 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the magnetic properties of flat permalloy cylinders by Lorentz transmission electron microscopy and micromagnetic simulations. The magnetization patterns during in situ magnetizing experiments have been imaged and they revealed that the magnetization reversal of the cylindrically shaped dots investigated is determined by the formation and annihilation of magnetic vortices. Furthermore, the experiments and micromagnetic simulations showed a dependence of the vortex annihilation field not only on the aspect ratio but also on the absolute thickness of the cylinders. The diameter of the cylindrical dots was varied between 150 and 1000 nm, and the thicknesses were 3, 5.5, 8.3, 15, and 20 nm, respectively. The formation of inhomogeneous magnetization patterns prior to vortex evolution was observed and by a comparison of the experimental to simulated Fresnel images these patterns can be identified as S- and C-like states. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1490623
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  • 7
    Electronic Resource
    Electronic Resource
    Magnetic switching of single vortex permalloy elements (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 3113-3115 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic vortices play an important role in the switching behavior of micron- and submicron-sized ferromagnetic elements. We have prepared submicron permalloy elements by a combination of electron-beam lithography and liftoff technique on electron transparent membrane substrates. The magnetization reversal mechanism and the remanent magnetization configuration were observed by means of Lorentz transmission electron microscopy. In remanence, the investigated structures form a vortex configuration. In situ magnetizing experiments showed the possibility of adjusting the sense of magnetization rotation by introducing a slight geometric asymmetry to the otherwise circular nanostructures. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1410873
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  • 8
    Electronic Resource
    Electronic Resource
    Lorentz microscopy of circular ferromagnetic permalloy nanodisks (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 2909-2911 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Circular permalloy elements were fabricated by a combination of electron beam lithography, thermal evaporation and liftoff technique on electron transparent membrane substrates. The magnetic properties have been studied by Lorentz transmission electron microscopy. In situ magnetizing experiments have been carried out to obtain information about the nucleation and propagation of magnetic domains within the permalloy nanodisks and to determine the nucleation and saturation fields. The diameter of the patterned elements has been varied between 180 and 950 nm, the height was 15 nm. The experiments showed that the vortex configuration is the most favorable state in zero field conditions of all investigated permalloy nanodisks. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1320465
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  • 9
    Electronic Resource
    Electronic Resource
    Spatial confinement of misfit dislocations at the interface of CdSe/GaAs(111) (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2947-2948 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-resolution electron microscopy of wurtzite type CdSe epilayers grown on (111) GaAs revealed that interfacial misfit dislocations are perfect 60° dislocations with Burgers vectors parallel to the interface. Glide is therefore limited to the (0001) interface plane and the extension of dislocations into the epilayer is suppressed. Single-beam bright field imaging shows that the 7% mismatched epilayer is free of a dislocation network in its volume.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.110281
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  • 10
    Electronic Resource
    Electronic Resource
    Ordered structures in ''amorphous'' Fe-B-alloys
    Amsterdam : Elsevier
    Journal of Magnetism and Magnetic Materials 45 (1984), S. 382-388 
    Details
    ISSN: 0304-8853
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0304-8853(84)90034-9
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