Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
66 (1995), S. 4921-4924
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The article presents a novel vertical-dispersion variant of the Johann spectrograph. Very good focusing properties, extremely high spectral resolution, and one-dimensional spatial resolution of this instrument open new possibilities in x-ray spectroscopy, especially in x-ray diagnostics of high-temperature plasmas. Basic characteristics of the spectrograph scheme are analyzed in detail by using ray tracing procedure. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1146175
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