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  • 1990-1994
  • 1985-1989  (2)
  • 1965-1969  (1)
  • 1986  (2)
  • 1969  (1)
Material
Years
  • 1990-1994
  • 1985-1989  (2)
  • 1965-1969  (1)
Year
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 226 (1969), S. 160-174 
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Cesium atoms, enclosed in a glass vessel, are excited by a weak electrical discharge and irradiated by monochromatic light with wavelengths corresponding to the sharp, diffuse, and fundamental series. By light absorption, highly excited atoms are produced, which are ionized by electron collisions. These ions diffuse into the space charge region of a diode path, compensate partially the space charge, and increase the thermionic diode current. By this method, ionic currents of about 10 ions per sec can be detected. If the wavelength of the incident light is varied continuously, the complete absorption spectrum of excited cesium atoms can be found in the recorded diode current.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Hyperfine interactions 30 (1986), S. 291-295 
    ISSN: 1572-9540
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The magnetic moment μ=−(1.69±0.47) μN of the 15/2+, 3578 KeV level in67Ga was determined from measurements of the integral perturbed angular distributions in implanted sources. The excited levels were populated by the reaction56Fe(16O, αp)67Ga.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 15 (1986), S. 107-109 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Measurements of the target-thickness dependence of the target K x-ray production yields are reported for 1 and 2 MeV/amu Sq+ (q = 6 and 8) ions incident upon thin solid targets of Ge. Target K x-ray production cross-sections were extracted in the limit of vanishing target thickness. Comparisons of the data with theoretical estimates based on combinations of direct ionization and electron-transfer processes are presented.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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