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Trace determination of silicon by heavy ion activation analysis (1984)

Colin, M. ; Friedli, C. ; Lerch, P.

Springer

Journal of radioanalytical and nuclear chemistry 84 (1984), S. 355-361

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ISSN: 1588-2780

Quelle: Springer Online Journal Archives 1860-2000

Thema: Chemie und Pharmazie , Energietechnik

Notizen: Abstract The Si(11B, x)34mCl and Si(19F, x)44mSc reactions have been studied in order to work out their capabilities in determining traces of silicon. The first one has been tested with beam energies ranging from 19 to 27 MeV11B; only Mg and Al have shown nuclear interferences and a 30-min 27 MeV11B irradiation yields a 14 ng detection limit. The second reaction, investigated in between 35 and 46 MeV19F, yields a 16 ng detection limit with a 2 hrs 46 MeV19F irradiation; at that energy only Al and P present nuclear interferences.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/BF02036975

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