Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
16 (1987), S. 57-60
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The Silica structural framework in plant materials can be separated from the organic part by acid leaching and can be examined by SEM. Scanning electron micrographs characterizing the bonding and distribution patterns of silica in rice husk, rice straw and sugarcane leaves are presented. The differences in the surface morphology of the three plant products are discussed.
Additional Material:
12 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300160204
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