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  • 1995-1999  (2)
  • 1996  (2)
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  • 1995-1999  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1198-1200 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electromigration in thin films of aluminium and aluminium alloys is shown to lead to stepwise increases of the electrical 1/f noise. These are attributed to the generation of highly mobile defect configurations by a nucleation-and-growth process. It is conjectured that among them may be the defects that are responsible for the eventual failure of VLSI electronic devices by electromigration damage. 1/f noise promises to be an early indicator of this damage. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1588-2780
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract Correlated measurements of the individual positron lifetimes (so-called positron ages) and of the Doppler shift of the 2γ-annihilation photon energy (Age-Momentum Correlation, AMOC) allow the evolution of the positron states to be observed in the time domain. The AMOC technique is thus especially useful when “chemical” reactions of positronium induce transitions between positron states. The full information contained in the AMOC data may be extracted from the two-dimensional AMOC histogramme, the so-called AMOC relief, by fitting a suitable two-dimensional model function. In this way quantitative information on the spin conversion of positronium by a paramagnetic radical in the systems HTEMPO/methanol and HTEMPO/benzene and on the formation of positron bound states in aqueous solutions of various sodium halides has been deduced.
    Type of Medium: Electronic Resource
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