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  • 2000-2004  (2)
  • 1915-1919
  • 2002  (2)
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  • 2000-2004  (2)
  • 1915-1919
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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1945-1947 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The electronic properties of the (100) Si/SiO2 interfacial defect called Pb1 are quite controversial. We present electron spin resonance measurements that demonstrate: (1) that the Pb1 defects have levels in the silicon band gap, (2) that the Pb1 correlation energy is significantly smaller than that of the Pb1 defect, and (3) that the Pb1 levels are skewed toward the lower part of the silicon band gap. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Science Ltd
    Fatigue & fracture of engineering materials & structures 25 (2002), S. 0 
    ISSN: 1460-2695
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Effect of microstructure on mixed-mode (mode I + II), high-cycle fatigue thresholds in a Ti-6Al-4V alloy is reported over a range of crack sizes from tens of micrometers to in excess of several millimeters. Specifically, two microstructural conditions were examined—a fine-grained equiaxed bimodal structure (grain size ∼20 µm) and a coarser lamellar structure (colony size ∼500 µm). Studies were conducted over a range of mode-mixities, from pure mode I (ΔKII/ΔKI = 0) to nearly pure mode II (ΔKII/ΔKI ∼ 7.1), at load ratios (minimum load/maximum load) between 0.1 and 0.8, with thresholds characterized in terms of the strain-energy release rate (ΔG) incorporating both tensile and shear-loading components. In the presence of through-thickness cracks—large (〉 4 mm) compared to microstructural dimensions—significant effects of mode-mixity and load ratio were observed for both microstructures, with the lamellar alloy generally displaying the better resistance. However, these effects were substantially reduced if allowance was made for crack-tip shielding. Additionally, when thresholds were measured in the presence of cracks comparable to microstructural dimensions, specifically short (∼200 µm) through-thickness cracks and microstructurally small (〈 50 µm) surface cracks, where the influence of crack-tip shielding would be minimal, such effects were similarly markedly reduced. Moreover, small-crack ΔGTH thresholds were some 50–90 times smaller than corresponding large crack values. Such effects are discussed in terms of the dominant role of mode I behaviour and the effects of microstructure (in relation to crack size) in promoting crack-tip shielding that arises from significant changes in the crack path in the two structures.
    Type of Medium: Electronic Resource
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