ISSN:
1434-6036
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract. Dielectric properties of silver/SiO2 nanocomposite thin films grown by high-pressure d.c. sputtering technique were studied by spectroscopic ellipsometry (300-800 nm). The dielectric behavior of the nanocomposite thin films largely depended on the particle size, its number density and the surrounding environments. The films showed semiconductor-like behavior up to a critical particle size and concentration, beyond which the films exhibited the typical surface plasmon resonance characteristics in their optical properties. The refractive index was also found to have a strong dependence on the particle size and its dispersion in the matrix. The results were found to be consistent with those obtained from UV-VIS optical absorbance data. Bruggeman effective medium theory was used to explain the experimental results.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1140/epjb/e2003-00192-5
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