ISSN:
1662-8985
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
This time, we would like to report our recent study on Pb(ZrTi)O3(PZT)-basedferroelectrics, currently one of interesting topics in condensed matter science. In this study, a newmethod, called synchrotron X-ray microdiffraction (XRMD) in situ, was introduced to examine theelectric field-induced structural modulation of the epitaxially grown tetragonal PZT thin film. Toevaluate the d-spacing (d001) from the measured intensity contour in the two theta-chi space, the peakposition in each diffraction profile was determined by applying the two-dimensional Lorentzianfitting. By tracing the change of d-spacing as a function of the applied electric field and by examiningthe Landau free energy function for P4mm symmetry, we were able to estimate the two importantparameters that characterize the field-induced structural modulation. Further theoretical analysisshows that the compressive epitaxial in-plane stress dominantly contributes to the elongation of thec-axis lattice constant in the c-axis oriented epitaxial PZT film
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/40/transtech_doi~10.4028%252Fwww.scientific.net%252FAMR.26-28.1079.pdf
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