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  • 2005-2009  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 324-325 (Nov. 2006), p. 1241-1244 
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: A series of strain fatigue tests were carried out on small bugle-like slice-specimens ofZr-4 alloy at 20[removed info] and 400[removed info]. According to Elastic and Plastic Finite Element Analysis [removed info]and assumption of local damage equivalence, a strain formula was given to transform transversestrain of the specimen to uniaxial strain. Based on the test results of the alloy and the strain transformformula, M-C (Manson-Coffin) models to be used for estimating uniaxial fatigue life of Zr-4alloy were obtained. The results show that, the alloy mainly behaves as cyclic softening at 20[removed info] andas cyclic hardening at 400[removed info], and the elevated temperature can lead serious additional fatigue damageof the alloy and the effect of the elevated temperature impairs gradually with increasing of amplitudestrain. A conclusion is helpful that prediction life by using M-C model based on traditionalstrain transform equation is quite conservative when uniaxial strain amplitude is less than 0.5%
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 385-387 (July 2008), p. 293-296 
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Based on compliance testing of a straight-notch compact tensile (SN-CT) or a single edgebending (SEB) specimen, this paper present a formula with increment form to calculate plastic part ofJ-integral, two formulas for a SN-CT specimen and a SEB specimen to transform crack mouthopening displacement (CMOD) v0 to the crack opening displacement (COD) q along load line, andsimplified formulas to estimate crack length a and effective young’s modulus E. Furthermore, therelation between v and q of the SN-CT specimens of 45 steel and SEB specimens of 30Cr steel wereinvestigated. The results show that the formulas to describe the relation between the ratio v/q and thedimensionless crack length a/w of the specimens accord with the testing results better
    Type of Medium: Electronic Resource
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  • 3
    Book
    Book
    Cambridge [u.a.] :Cambridge University Press,
    Title: Optoelectronic devices /
    Author: Li, Xun
    Publisher: Cambridge [u.a.] :Cambridge University Press,
    Year of publication: 2009
    Pages: XII, 361 S. : , graph. Darst.
    ISBN: 0-521-87510-2 , 978-0-521-87510-3
    Type of Medium: Book
    Language: English
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