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  • 2000-2004  (4)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 6545-6548 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The electrical characteristics of highly dense SnO2 ceramic varistors are believed to be caused by the existence of potential barriers at the grain boundary. A complex plane analysis technique (to eliminate the influence of trapping activity associated with the conductance term observed via depression angle of a semicircular relaxation in the complex capacitance plane), allied with an approached Mott–Schottky model, are used to demonstrate that the potential barriers at the grain boundary are Schottky-type barriers in SnO2 varistors such as those observed in the traditional ZnO varistor. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 3416-3419 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ferroelectric SrBi2Ta2O9 thin films on Pt/Ti/SiO2/Si were successfully synthesized by the modified polymeric precursor method. The films were deposited by spin coating and crystallized by rapid thermal annealing in a halogen lamp furnace, followed by postannealing at temperatures ranging from 700 °C to 800 °C in an oxygen atmosphere. Microstructural and phase evaluations were followed by x-ray diffraction and atomic force microscopy. The films displayed spherical grain structures with a superficial roughness of approximately 3–6 nm. The dielectric constant values were 121 and 248 for films treated at 700 °C and 800 °C, respectively. The P–E curve showed a voltage shift toward the positive side, which was attributed to crystallization under the halogen illumination. The remanent polarization (2Pr) and coercive field (Ec) were 7.1 μC/cm2 and 113 kV/cm, and 18.8 μC/cm2 and 93 kV/cm for the films treated at 700 °C and 800 °C, respectively. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 6007-6014 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article describes the admittance-frequency feature of a class of SnO2⋅CoO-based polycrystalline ceramics with high nonlinear current–voltage characteristics (nonlinear coefficients above 50). Broad relaxation peaks caused by the presence of deep trap states were characterized based on the admittance response of different systems doped with La2O3, Pr2O3, and CeO2. The calculation of the energy of this deep trap level revealed not only that all the compositions share the same value but also that this value could be attributed to an oxygen vacancy or to CoSn[partial lengthening] like defects. The values of barrier height and density of states obtained from a capacitance–voltage analysis are in good agreement with the nonlinear coefficients. The highest nonlinear coefficients are found in compositions with greater barrier height values and higher density of deep trap states at the grain boundary interface. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 48-50 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A model is proposed here to explain how the chemical features of metal oxide varistors can alter their nonohmic physical behavior, based on nonohmic similarities in the electrical properties of ZnO- and SnO2-based varistors. The proposed model explains the electrical properties of ZnO- and SnO2-based varistors before and after thermal treatments in oxygen- and nitrogen-rich atmospheres, which cause similar changes in the nonohmic feature of these polycrystalline ceramics with greatly differing chemical compositions and microstructures. The model is based on the key role that oxygen plays in varistor grain boundaries, independently of the type of ceramic system (ZnO-, SnO2- or even SrTiO3-based varistors) involved. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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