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  • 2000-2004  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Surface-step-induced magnetic anisotropy of p(1×1) Fe on W(100) (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 6671-6673 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magneto-optic Kerr effect measurements of ultrathin p(1×1) Fe films on graded-step-density W(100) are used to study step-induced magnetic anisotropy. Spot-profile-analysis low-energy-electron diffraction is used to characterize the stepped W(100) surface prior to film growth and the epitaxial Fe layer after vapor deposition. The experimental results are qualitatively compatible with prior experiments and with theoretical predictions based on the Néel model and on a one-dimensional micromagnetic model proposed by Hyman, Zangwell, and Stiles (HZS). The observed evolution of hysteresis loop shape as a function of step density and anisotropy strength (which was varied by chemisorption of oxygen) is observed to be consistent with a hysteresis loop phase diagram based on the HZS model. However, the measured variation of switching field versus vicinal angle α for 2 monolayer thick Fe films differs significantly from the quadratic dependence predicted by the Néel model and from the dependence predicted by HZS. The surface-step-induced anisotropy vanishes at high vicinality (α∼10°) and novel two-state switching is observed at specific vicinal angles. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1355319
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  • 2
    Electronic Resource
    Electronic Resource
    High-speed high spatial resolution magneto-optic Kerr effect polarimeter/microscope for studies of ultrathin magnetic structures (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3141-3147 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A magneto-optic Kerr effect polarimeter designed to study the dynamics of magnetization reversal in ultrathin films, multilayer films, and microstructures is described. The polarimeter is integrated into a long focal-length charge coupled device (CCD) camera based Kerr microscope that permits viewing domain structures and facilitates positioning of the focused polarimeter beam on microstructures in ultrahigh vacuum. Diffraction-limited spatial resolution, based on the f-number of the respective objective lenses, is achieved by the microscope (∼1 μm) and polarimeter (∼5 μm). The polarimeter is capable of measuring continuous wave or repetitive transient ultrathin film magnetic response at sampling rates of 40 million samples/s (MS/s) over a micron-scale region defined by the illuminating spot. Hysteresis loops generated by ultrathin (monolayer) films and microstructures can be measured at high signal-to-noise ratio over a nine-decade range of drive frequencies. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1304864
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    Paper (German National Licenses)
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