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  • 2000-2004  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Waveguide ultrasonic force microscopy at 60 MHz (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 1836-1838 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present measurements using ultrasonic force microscopy at ∼60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson–Kendall–Roberts model of the force-distance curve. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126184
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Hysteresis of the cantilever shift in ultrasonic force microscopy (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 2386-2388 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We propose a technique based on ultrasonic force microscopy that exploits the hysteresis in cantilever jumping to and from a sample while varying the ultrasonic amplitude. Both the elastic modulus and the work of adhesion can be determined by comparision with a relation derived between their ratio and the cantilever shift at the jump-in point. The method is applied to measurements on an aluminum thin film. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1463212
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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