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  • 2000-2004  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    A high-pressure scanning tunneling microscope (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 3537-3542 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present the design and performance of a high-pressure scanning tunneling microscope (HP–STM), which allows atom-resolved imaging of metal surfaces at pressures ranging from ultrahigh vacuum (UHV) to atmospheric pressures (1×10−10–1000 mbar) on a routine basis. The HP–STM is integrated in a gold-plated high-pressure cell with a volume of only ∼0.5 l, which is attached directly to an UHV preparation/analysis chamber. The latter facilitates quick sample transfer between the UHV chamber and the high-pressure cell, and allows for in situ chemical and structural analysis by a number of analytical UHV techniques incorporated in the UHV chamber. Reactant gases are admitted to the high-pressure cell via a dedicated gas handling system, which includes several stages of gas purification. The use of ultrapure gasses is essential when working at high pressures in order to achieve well-defined experimental conditions. The latter is demonstrated in the case of H/Cu(110) at atmospheric H2 pressures where impurity-related structures were observed. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1389497
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    A fast-scanning, low- and variable-temperature scanning tunneling microscope (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 1438-1444 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and performance of a fast-scanning, low- and variable-temperature, scanning tunneling microscope (STM) incorporated in an ultrahigh vacuum system is described. The sample temperature can be varied from 25 to 350 K by cooling the sample using a continuous flow He cryostat and counter heating by a W filament. The sample temperature can be changed tens of degrees on a time scale of minutes, and scanning is possible within minutes after a temperature change. By means of a software implemented active drift compensation the drift rate can be as low as 1 nm/day. The STM is rigid, very compact, and of low weight, and is attached firmly to the sample holder using a bayonet-type socket. Atomic resolution on clean metal surfaces can be achieved in the entire temperature range. The performance of the instrument is further demonstrated by images of adsorbed hexa-tert-butyl-decacyclene molecules on Cu(110), by STM movies, i.e., sequential STM images with a time resolution down to 1 s/image (100×100 Å2 with 256×256 pixels), of the mobility of these molecules, and finally by constant current images of standing waves in the electronic local density of states on Cu(110). © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1337068
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Fast and accurate current-voltage curves of metallic quantum point contacts (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 1793-1803 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present an experimental setup for measuring the electrical conductance through metallic quantum point contacts (QPCs) under constant or time-dependent bias voltage conditions. The response time of the setup is as short as 25 ns and typical bias voltages range from 10 mV to 2 V. A function generator is used as bias voltage supply. With this, voltage bursts with a frequency of up to 100 kHz can be applied to the QPCs, whereby current-to-voltage (I–V) curves can be acquired using a homebuilt, 30 MHz bandwidth I–V converter, and a 100 Msamples/s digital storage oscilloscope. Test experiments on resistors show that nonlinear contributions to the I–V curves are always less than 1% of the current for all applied voltages. From the slope of the I–V curves, the conductance can be determined with an accuracy better than 1%. The QPCs are formed between a single-crystal metal sample and the tip of a scanning tunneling microscope under clean ultrahigh vacuum conditions. We demonstrate how the setup can be used to capture the I–V curves of several metastable states in a Au QPC, as it breaks during a period of 200 μs at room temperature. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150539
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    Paper (German National Licenses)
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