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Sapphire filter thickness optimization in neutron scattering instruments (2000)

Stamatelatos, I. E. ; Messoloras, S.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 71 (2000), S. 70-73

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: The present work is concerned with the optimization of the sapphire fast neutron filter thickness used in neutron diffraction instruments. The optimization is based on maximization of the slow neutron transmission, minimization of the fast neutron transmission, and also taking into consideration the neutron background at the vicinity of an instrument. Scattering properties of the sapphire in the fast and slow neutron regions are discussed. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1150163

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