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  • 1
    Electronic Resource
    Electronic Resource
    Formation of silver nanoclusters by excimer–laser interaction in silver-exchanged soda-lime glass (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 2456-2458 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-power excimer-laser irradiation (248 nm wavelength) at different energy densities (1.3, 2.3, and 4.6 J/cm2) has been performed on silver-exchanged soda-lime glass. Silver nanoclusters have been obtained with average size depending on the energy density of the laser pulses. The excimer laser pulses induce either the reduction of the silver ions or the heating of the irradiated glass matrix. The high mobility of silver atoms in the liquid phase and the segregation effects at the liquid–solid interface can explain the observed silver atoms clustering. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1406984
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  • 2
    Electronic Resource
    Electronic Resource
    Clustering of silver atoms in hydrogenated silver–sodium exchanged glasses (2000)
    Springer
    Applied physics 70 (2000), S. 415-419 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 42.70; 61.46. +w; 68.55. Ln
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract. The diffusional growth regime of silver clusters in hydrogenated silver–sodium exchanged glasses has been numerically analysed. The diffusion coefficients of the three elements that contribute to silver cluster formation, namely H, Ag+, and Ag0, have been established. The activation energy of the reactant Ag0 diffusion coefficient is consistent in the three analysed different experimental results: Ag loss through evaporation, near-surface Ag accumulation, and optical absorption density. The calculated Ag0 diffusion coefficient accounts for the threshold time necessary to obtain a cluster size to give rise to a detectable absorption.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s003390051059
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  • 3
    Electronic Resource
    Electronic Resource
    Structure and mechanical properties of low stress tetrahedral amorphous carbon films prepared by pulsed laser deposition (2002)
    Springer
    The European physical journal 25 (2002), S. 269-280 
    Details
    ISSN: 1434-6036
    Keywords: PACS. 81.15Fg Laser deposition – 78.30.Ly Disordered solids – 68.60.-p Physical properties of thin films, nonelectronic – 62.20.Qp Tribology and hardness
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: Tetrahedral amorphous carbon films have been produced by pulsed laser deposition, at a wavelength of 248 nm, ablating highly oriented pyrolytic graphite at room temperature, in a 10-2 Pa vacuum, at fluences ranging between 0.5 and 35 Jcm-2. Both (100) Si wafers and wafers covered with a SiC polycrystalline interlayer were used as substrates. Film structure was investigated by Raman spectroscopy at different excitation wavelength from 633 nm to 229 nm and by transmission Electron Energy Loss Spectroscopy. The films, which are hydrogen-free, as shown by Fourier Transform Infrared Spectroscopy, undergo a transition from mainly disordered graphitic to up to 80% tetrahedral amorphous carbon (ta-C) above a threshold laser fluence of 5 J cm-2. By X-ray reflectivity roughness, density and cross-sectional layering of selected samples were studied. Film hardness as high as 70 GPa was obtained by nanoindentation on films deposited with the SiC interlayer. By scratch test film adhesion and friction coefficients between 0.06 and 0.11 were measured. By profilometry we obtained residual stress values not higher than 2 GPa in as-deposited 80% sp3 ta-C films.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1140/epjb/e20020031
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