ISSN:
1600-5775
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
An X-ray spectrometer for high-resolution Compton profile measurements using 90–120 keV X-rays has been designed and constructed at SPring-8. A Cauchois-type triply layered bent-crystal analyzer was employed for the energy analysis. A novel use of a solid-state detector with a large active area was devised as a position-sensitive detector. A resolution of 0.10 atomic units in electron momentum has been achieved at an incident X-ray energy of 115 keV. A Compton profile of a single crystal of Nb was measured with a counting rate of 30 counts s−1 at the Compton peak, which demonstrates that the spectrometer is capable of measuring Compton profiles of heavy-element materials.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0909049500018197
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