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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 18 (2000), S. 257-261 
    ISSN: 1434-6036
    Keywords: PACS. 74.72.Hs Bi-based cuprates - 61.10.Ht X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc. - 74.80.-g Spatially inhomogeneous structures
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: Instantaneous in-plane Cu-O bond distribution in the Bi2Sr2CaCu2O8+β (Bi2212) superconductor has been investigated by high k-resolution Cu K-edge extended X-ray absorption fine structure (EXAFS) measured with polarized vector parallel to the two orthogonal Cu-O-Cu bonds of the CuO2 square plane. The results show an anisotropic Cu-O distribution in the two directions and provide further information on the local atomic displacements in the lattice-charge stripes.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract. We have studied doping evolution of the temperature dependent local Cu-O displacements in the La2-x Sr x CuO4 superconductor by polarized Cu K-edge extended X-ray absorption fine structure (EXAFS) measurements. While temperature dependent Debye-Waller factor of the Cu-O bonds, measuring the local Cu-O displacements, shows an anomalous increase at low temperature for the underdoped single crystals, we do not find such a dependence for the case of the overdoped system. The results, which are discussed in the light of recent angle resolved photoemission measurements, provide an evidence for some important correlation between the doping dependent electron-lattice interaction, the charge inhomogeneities and the local Cu-O displacements in the copper oxide superconductors.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 8 (2001), S. 511-513 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Local structure of Ge nanocrystals embedded in SiO2 has been studied by X-ray absorption fine structure on the Ge K-edge. The XANES and EXAFS results indicate that Ge atoms in samples with the Ge concentration x=25-40 mol. % are coordinated with oxygen atoms, while they exist as amorphous Ge clusters in samples with x=60 mol. %. Upon annealing, completely relaxed crystalline Ge phase is formed for samples with x=60 mol. %, in contrast to the x=25-40 mol. % sample, which show little or no indication of Ge cluster formation. A possible mechanism of Ge nanocluster formation is discussed.
    Type of Medium: Electronic Resource
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