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  • 2000-2004  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 3101-3107 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this article we report on the novel use of a Pt/AlN/SiC structure as a combustible gas sensor. This device structure was fabricated by depositing a 2000 Å thick layer of AlN on the SiC substrate at 900 °C by laser ablation. Catalytic Pt gates were deposited onto the AlN at room temperature either by laser ablation or by rf sputtering. The electrical characteristic of the resultant devices from room temperature to 650 °C revealed current rectifying behavior. Most importantly, their electrical characteristic changed in response to propane, propylene, and CO introduced into their ambient at temperatures as low as 250 °C. They responded to changing gas composition over a wide range of combustible and oxygen concentrations from lean to fuel rich conditions. The response was a function of the ratio of combustible/oxygen concentration rather than to the absolute combustible concentration. However, this relationship exhibited some degree of combustible specificity. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 632-634 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial Al1−xInxN thin films with 0≤x≤1 have been grown by plasma source molecular beam epitaxy on sapphire (0001) substrates at a low temperature of 375 °C. Both reflection high-energy electron diffraction and x-ray diffraction measurements confirm the c-plane growth with the following epitaxial relations: nitride [0001] (parallel) sapphire [0001] and nitride 〈011¯0〉 (parallel) sapphire 〈21¯1¯0〉. However, the degree of crystalline mosaicity and the compositional fluctuation increase with increasing x. The observed direct energy band gap, determined using optical transmission and reflection measurements show relatively less bowing compared to some earlier studies. Electrical resistivity and Hall effect measurements show n-type electrical conductivity in these alloys with carrier concentrations n≥1019 cm−3 for In-rich alloys and n≤1010 cm−3 for Al-rich alloys. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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