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  • 2000-2004  (1)
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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 119-127 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Recent development of the JT-60U charge exchange recombination spectroscopy (CXRS) diagnostic system is reported. The measurements of the radial profiles of the ion temperatures, the toroidal and poloidal rotation velocities, and the impurity density are based on CXR spectra of fully stripped carbon ions induced by neutral beam injection. Measurements are made simultaneously at 59 spatial points (23 toroidal and 36 poloidal) with a time resolution of 1/60 s throughout the full discharge pulse of 15 s. Considerable effort has been expended to ensure the automatic provision of reliable profile data, where the mechanical components of the system must cope with both a baked tokamak vessel (∼300 °C) and an expected disruption-induced acceleration of up to 60 g, where g denotes the gravitational acceleration, i.e., 9.8 m2/s. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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