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  • 1
    Electronic Resource
    Electronic Resource
    Lateral Current Spreading in SiC Schottky Diodes using Field-Plate Edge Termination (2000)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 338-342 (May 2000), p. 1223-1226 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/05/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.338-342.1223.pdf
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  • 2
    Electronic Resource
    Electronic Resource
    Computer Simulation of P-type SiC Schottky Diode using ATLAS (2000)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 338-342 (May 2000), p. 1231-1234 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/05/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.338-342.1231.pdf
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  • 3
    Electronic Resource
    Electronic Resource
    Nitrification Inhibition by Naphthalene Derivatives and Its Relationship with Copper (2000)
    Springer
    Bulletin of environmental contamination and toxicology 64 (2000), S. 542-549 
    Details
    ISSN: 1432-0800
    Source: Springer Online Journal Archives 1860-2000
    Topics: Energy, Environment Protection, Nuclear Power Engineering , Medicine
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s001280000037
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  • 4
    Electronic Resource
    Electronic Resource
    Occupation Measures of Singularly Perturbed Markov Chains with Absorbing States (2000)
    Springer
    Acta mathematica sinica 16 (2000), S. 161-180 
    Details
    ISSN: 1000-9574
    Keywords: Key words Singularly perturbed Markov chain, Occupation measure, Aggregation, Absorbing state, Weak convergence, Switching diffusion ; 1991MR Subject Classification 60J27, 60B10, 34E05, 60F17
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Abstract This paper develops asymptotic properties of singularly perturbed Markov chains with inclusion of absorbing states. It focuses on both unscaled and scaled occupation measures. Under mild conditions, a mean-square estimate is obtained. By averaging the fast components, we obtain an aggregated process. Although the aggregated process itself may be non-Markovian, its weak limit is a Markov chain with much smaller state space. Moreover, a suitably scaled sequence consisting of a component of scaled occupation measures and a component of the aggregated process is shown to converge to a pair of processes with a switching diffusion component.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s101140050013
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  • 5
    Electronic Resource
    Electronic Resource
    SHELF-LIFE EVALUATIONS OF LIQUID FOODS TREATED BY PILOT PLANT PULSED ELECTRIC FIELD SYSTEM (2001)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of food processing and preservation 25 (2001), S. 0 
    Details
    ISSN: 1745-4549
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Process Engineering, Biotechnology, Nutrition Technology
    Notes: There is a pressing need to validate the shelf-life extension of Pulsed Electric Field (PEF) treated foods. This study was designed to evaluate the shelf-lives of cranberry juice and chocolate milk as a function of PEF and the interaction of PEF+heat treatments. Cranberry juice was exposed to PEF and PEF+heat (60C), and chocolate milk to PEF+heat (105 and 112C). Microbial analysis and color measurement were performed on untreated and treated cranberry juice and chocolate milk aseptically packaged and stored at 4, 22, and 37 C for 197 and 119 days, respectively. Microbial analysis of cranberry juices demonstrated that the shelf-life of PEF and PEF+heat treated juices stored at 22 and 37 C increased significantly during 197 days (p〈0.05). The shelf-life of chocolate milk treated by PEF+105C and PEF+112C increased significantly at all storage temperatures (p〈0.05). The PEF nor PEF+heat treatments did not result in any significant differences in color retention of either cranberry juice or chocolate milk (p〉0.05). This study presented that PEF and PEF+heat treatments were very effective to increase shelf-lives of cranberry juice and chocolate milk.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1745-4549.2001.tb00461.x
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  • 6
    Electronic Resource
    Electronic Resource
    INACTIVATION OF SELECTED MICROORGANISMS AND PROPERTIES OF PULSED ELECTRIC FIELD PROCESSED MILK (2003)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of food processing and preservation 27 (2003), S. 0 
    Details
    ISSN: 1745-4549
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Process Engineering, Biotechnology, Nutrition Technology
    Notes: Raw skim milk and ultra-high-temperature (UHT) skim milk inoculated with Pseudomonas fluorescens, Lactococcus lactis and Bacillus cereus were processed by pulsed electric field (PEF) treatment. A continuous PEF bench scale system was set to deliver 35 kV/cm field strength with 64 pulses of bipolar square wave for 188 μs. The flow rate of milk was 1 mL/s. Milk temperature was raised to 52C and cooled to 22C during PEF treatment. Pasteurization at 73C for 30 s was used for comparison. Microbial inactivation and cell morphology were investigated. Analyses for protein, total solids, color, pH, particle size, density and electrical conductivity showed no significant effects (P 〉 0.05) in the PEF processed milk. PEF treatment accomplished a 0.3 to 3.0 log reduction of P. fluorescens, L. lactis and B. cereus in UHT milk and of total microorganisms in raw milk.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1745-4549.2003.tb00507.x
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  • 7
    Electronic Resource
    Electronic Resource
    PROCESSING OF YOGURT-BASED PRODUCTS WITH PULSED ELECTRIC FIELDS: MICROBIAL, SENSORY AND PHYSICAL EVALUATIONS (2004)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of food processing and preservation 28 (2004), S. 0 
    Details
    ISSN: 1745-4549
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Process Engineering, Biotechnology, Nutrition Technology
    Notes: Yogurt-based products similar to a dairy pudding dessert were formulated and processed by mild heat and pulsed electric fields (PEF) to investigate the effects of combined mild heat and PEF treatment on the microbial stability and quality of high viscosity foods. Commercial plain low fat yogurt was mixed with fruit jelly and corn syrup and processed by mild heat treatment at 60C for 30 s and 30 kV/cm electric field strength for 32 μs total treatment time using OSU-2C pilot plant scale PEF system. Control and processed products were aseptically packaged and stored at 4 and 22C. Mild heat combined with PEF treatment significantly decreased the total viable aerobic bacteria and total mold and yeast of yogurt-based products during storage at both 4 and 22C (P ≤ 0.05). Mild heat treatment alone without any PEF treatment did not prevent the growth of microorganisms in yogurt-based products. Sensory evaluation indicated that there was no significant difference between the control and processed products (P ≤ 0.05). Color, pH and °Brix were not significantly affected by mild heat and PEF processing conditions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1745-4549.2004.tb00818.x
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  • 8
    Electronic Resource
    Electronic Resource
    WATER ACTIVITY AND THE INACTIVATION OF ENTEROBACTER CLOACAE INOCULATED IN CHOCOLATE LIQUOR AND A MODEL SYSTEM BY PULSED ELECTRIC FIELD TREATMENT (2002)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of food processing and preservation 26 (2002), S. 0 
    Details
    ISSN: 1745-4549
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Process Engineering, Biotechnology, Nutrition Technology
    Notes: Effects of water activity (aw) on the inactivation of Enterobacter cloacae inoculated in chocolate liquor and in a model system of 0.1% (w/v) peptone water and glycerol by pulsed electric field (PEF) treatment were investigated. An electric field strength of 24.5 kV/cm, a total treatment time of 320 μs, a pulse duration time of 4 βs, a pulse delay time of 15 βs, and a pulse cycle time of 15 s were selected for PEF treatment. The inactivation ofE. cloacae by PEF increased significantly as aw increased (P 〈 0. 05). As aw of chocolate liquor increased from 0.48 to 0.89, the log reduction of E. cloacae increased from 0.1 to 1.3. The measured temperature change inside the PEF treatment chamber was 0.4C when the log reduction was 1. 3. Similarly, as aw increased from 0. 51 to 0.91 in the model system, the log reduction increased from 0.4 to 1.3. E. cloacae surviving a low aw environment had high resistance to PEF. PEF inactivated E. cloacae in the chocolate liquor with aw of 0.85 by 1 log at O h incubation. However, the log reduction was only 0.1 when PEF treatment was applied to E. cloacae which was incubated for 2 h in the chocolate liquor with aw of 0.85 before PEF treatment. E. cloacae surviving the low aw environment might have resistance not only to the low aw but also to PEF. The resistance to low aw environment may need to be considered when the inactivation of microorganisms by PEF is evaluated.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1745-4549.2002.tb00488.x
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  • 9
    Electronic Resource
    Electronic Resource
    Enhanced photoemission of Ag–O–Cs composite thin films with an internal electric field (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 2227-2231 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ag–O–Cs thin films with internal field-assisted structure were fabricated, and enhanced photoemission was observed when the internal electric field was applied to the thin films. The increase of photoelectronic quantum yield, corresponding to the applied 30 V bias, was about 15.7%, while the thin films were irradiated by the light with wavelength of 510 nm. From an analysis of the electric potential distribution in the Ag–O–Cs thin films with the applied internal electric field, it is found that the interfacial barrier between the Ag nanoparticles and the Cs2O matrix is decreased and the vacuum level at the surface is degraded. The calculated barrier curves for various applied biases are illustrated to show the thinning effect of internal electric field on the interfacial barrier width. The theoretical lowering of interfacial barrier height is obtained as 0.08 and 0.22 eV when the thin films are stimulated by applied bias of 1 and 30 V, respectively. Further, a group of formulas as well, based upon the electric potential distribution in the Ag–O–Cs thin films, is deduced to describe the relationship between the applied bias and the degradation of the surface vacuum level. The enhanced photoemission of Ag–O–Cs thin films is attributed to the field-induced variations in the energy band structure which are considered to result in the increased probabilities for the photoexcited electrons to travel through the interfacial barrier and escape into the vacuum. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1334372
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  • 10
    Electronic Resource
    Electronic Resource
    Critical thickness of crystallization and discontinuous change in ferroelectric behavior with thickness in ferroelectric polymer thin films (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 2613-2616 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report on the observation of the critical thickness of crystallization of ferroelectric poly(vinylidene fluoride-trifluoroethylene) copolymer thin films, which were solution spun cast on platinum coated silicon wafer. The effect occurs at about 100 nm thickness, which is significantly above any currently known spatial dimensions of the polymer, so that for films at thickness below about 100 nm, the crystallization process is strongly hindered, resulting in a low crystallinity in these films. This low crystallinity leads to a large and discontinuous change of the dielectric constant and ferroelectric polarization in the films below the critical thickness. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1344585
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