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  • 2000-2004  (7)
  • 1
    Electronic Resource
    Electronic Resource
    Nucleation Behavior of α-Fe in Amorphous Fe-7Zr-5B-1Au Alloy (2000)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 343-346 (May 2000), p. 371-376 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/05/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.343-346.371.pdf
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  • 2
    Electronic Resource
    Electronic Resource
    Nucleation Behavior of α-Fe in Amorphous Fe-7Zr-5B-1Au Alloy (2000)
    s.l. ; Stafa-Zurich, Switzerland
    Journal of metastable and nanocrystalline materials Vol. 8 (May 2000), p. 371-376 
    Details
    ISSN: 1422-6375
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/43/transtech_doi~10.4028%252Fwww.scientific.net%252FJMNM.8.371.pdf
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  • 3
    Electronic Resource
    Electronic Resource
    Interlayer segregation of Cu atoms in Ta/NiFe/Cu/NiFe/FeMn/Ta spin-valve multilayers and its influence on magnetic properties (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 3759-3763 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Experimental results show that the exchange coupling field (Hex) of NiFe/FeMn for Ta/NiFe/FeMn/Ta multilayers is higher than that for spin-valve multilayers Ta/NiFe/Cu/NiFe/FeMn/Ta. In order to find out the reason, the composition and chemical states at the surface of Ta(12 nm)/NiFe(7 nm), Ta(12 nm)/NiFe(7 nm)/Cu(4 nm), and Ta(12 nm)/NiFe(7 nm)/Cu(3 nm)/NiFe(5 nm) were studied using x-ray photoelectron spectroscopy. The results show that no elements from lower layers float out or segregate to the surface in the first and second samples. However, Cu atoms segregate to the surface of Ta(12 nm)/NiFe(7 nm)/Cu(3 nm)/NiFe(5 nm) multilayers, i.e., Cu atoms segregate to the NiFe/FeMn interface for Ta/NiFe/Cu/NiFe/FeMn/Ta multilayers. We believe that the presence of Cu atoms at the interface of NiFe/FeMn is one of the important factors which causes the exchange coupling field (Hex) of Ta/NiFe/Cu/NiFe/FeMn/Ta to be weaker than that of Ta/NiFe/FeMn/Ta. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1450033
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  • 4
    Electronic Resource
    Electronic Resource
    Interface reaction of Ta/Ni81Fe19 or Ni81Fe19/Ta and its suppression (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 455-457 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ta/Ni81Fe19 and Ni81Fe19/Ta structures are commonly used in the magnetic multilayers with giant magnetoresistance. For a Ta/Ni81Fe19/Ta fundamental structure, Ta seed and Ta cap layers resulted in a loss of moment equivalent to a magnetically dead layer of thickness 1.6±0.2 nm. In order to find out the reason, the composition and chemical states at the interface regions of Ta/Ni81Fe19 and Ni81Fe19/Ta were studied using the x-ray photoelectron spectroscopy and peak decomposition technique. The results show that there are thermodynamically favorable reactions at the Ta/Ni81Fe19 and Ni81Fe19/Ta interfaces: 2Ta+Ni=NiTa2. However, the thickness of a magnetically dead layer was significantly reduced by the insertion of a small amount of Bi in the Ta/Ni81Fe19/Ta structure. This result indicates that a surfactant Bi can suppress the interface reaction in multilayers. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1433913
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  • 5
    Electronic Resource
    Electronic Resource
    Interface reaction of NiO/NiFe and its influence on magnetic properties (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1706-1708 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ta/NiO/NiFe/Ta multilayers were prepared by rf reactive and dc magnetron sputtering. The exchange coupling field between NiO and NiFe reached 120 Oe. The composition and chemical states at the interface region of NiO/NiFe were studied using the x-ray photoelectron spectroscopy (XPS) and peak decomposition technique. The results show that there are two thermodynamically favorable reactions at NiO/NiFe interface: NiO+Fe=Ni+FeO and 3NiO+2Fe=3Ni+Fe2O3. The thickness of the chemical reaction as estimated by angle-resolved XPS was about 1–1.5 nm. These interface reaction products are magnetic defects, and we believe that the exchange coupling field Hex and the coercivity Hc of NiO/NiFe are affected by these defects. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1343474
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  • 6
    Electronic Resource
    Electronic Resource
    “Sputtered-atom assembly” of carbon nanostructures during ion bombardment (2000)
    Springer
    Applied physics 71 (2000), S. 353-355 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 61.80.Jh; 81.05.Tp; 61.16.Bg
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract. We report the observation of a carbon nanostructure grown on a graphite surface by Ar+ ion bombardment. We demonstrate experimentally that, in view of transmission electron microscopy (TEM)-based evidence, some of these carbon nanostructures emerged the whiskerlike protrusion and/or the sputtered-surface, suggesting a new growth model for nanocarbon, distinctly different from that found in arc-discharge and many other methods.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s003390000559
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  • 7
    Electronic Resource
    Electronic Resource
    Solid transportation in the feeding zone of intermeshing co-rotating twin-screw extruders (2000)
    Springer
    Journal of polymer research 7 (2000), S. 135-147 
    Details
    ISSN: 1572-8935
    Keywords: Twin-screw ; Extrusion ; Solid conveying ; Polymer processing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract A mathematical model was proposed for the characteristics of solid transportation in the feeding zone of an intermeshing co-rotating twin screw extruder. The model was based on the observations made from a “transparent” extruder. The analysis considered optimal solid conveyed with maximum throughput rate, i.e., when the upper and lower intermeshing zones, and the two sides of the screws were all partially filled with solid resin to an extent that a slight increase in the solid filling would immediately cause blocking of the solid transportation. Because of these starve-fed characteristics, the conventional approach for analysing solid feeding used in single-screw extruders was inadequate for twin-screw extruders. This paper also suggests a solution for the mathematical expressions describing the stress and velocity fields in the solid feeding zone of a twin-screw extruder. Finally, the predicted values are compared with our experimental findings.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s10965-006-0113-0
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