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Digitale Medien

Impurity study of CdZnTe substrates used for LPE HgCdTe (1995)

Bollong, A. B. ; Feldewerth, G. ; Tower, J. P. ; [weitere]

New York, NY [u.a.] : Wiley-Blackwell

Advanced Materials for Optics and Electronics 5 (1995), S. 87-99

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Details

ISSN: 1057-9257

Schlagwort(e): purity ; CdZnTe ; characterization ; IR ; Chemistry ; Polymer and Materials Science

Quelle: Wiley InterScience Backfile Collection 1832-2000

Thema: Elektrotechnik, Elektronik, Nachrichtentechnik , Physik

Notizen: Impurites were tracked from raw material purification through to CdZnTe processing in an effort to identify the sources of elements which impact on IR photodetector performance. Chemical analyses by GDMS and ZCGFAA effectively showed the levels of impurities introduced into CdZnTe substrate material from the manufacturing processes. A new purification process (ISDZR) for raw materials was developed, resulting in improved CdZnTe substrate purity. Substrate CU contamination was found to have detrimental effects on LPE layer and device electrical properties for lightly doped HgCdTe.

Zusätzliches Material: 14 Ill.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1002/amo.860050205

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