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Digitale Medien

X-ray reflectivity of ultrathin twist-bonded silicon wafers (1999)

Eymery, J. ; Fournel, F. ; Rieutord, F. ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 75 (1999), S. 3509-3511

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: Ultrathin Si (001) layers (〈15 nm) are hydrophobic bonded to a full 4 in. Si (001) wafer. The interface quality and surface roughness, checked by specular x-ray reflectivity, are very good. This technique, well suited to measure the homogeneity thickness, shows that the samples have very small thickness fluctuations, and no extended defects. Quantitative analysis proves that the interfacial layer resulting from the bonding is very thin (about 8 Å). Its atomic density is significantly different from bulk Si only for large bonding twist angles (〉5°). © 1999 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.125371

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Digitale Medien

X-ray phase determination in multilayers (1989)

Rieutord, F. ; Benattar, J. J. ; Rivoira, R. ; [weitere]

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 45 (1989), S. 445-453

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ISSN: 1600-5724

Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Thema: Chemie und Pharmazie , Geologie und Paläontologie , Physik

Notizen: A procedure is described for the determination of the phases of waves scattered by a multilayer structure using interference between surface reflections and structure diffraction. The applicability of the method to Langmuir-Blodgett and metallic sputtered multilayers is discussed.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1107/S0108767389001327

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Digitale Medien

Study of the polymer-surfactant interaction in black films and monolayers (1997)

Benattar, J. J. ; Schalchli, A. ; Sentenac, D. ; [weitere]

Springer

Colloid & polymer science 105 (1997), S. 113-117

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ISSN: 1435-1536

Schlagwort(e): Black films ; monolayers ; polymer-surfactant interaction ; X-ray reflectivity ; surface diffraction

Quelle: Springer Online Journal Archives 1860-2000

Thema: Chemie und Pharmazie , Maschinenbau

Notizen: Abstract We present a study of the structure of mixed layers formed after deposition of one and two polymer monolayers on a surfactant sublayer. Two complementary systems are investigated: polymer-surfactant layers made at the surface of surfactant solutions and black films drawn from the same solutions. We mainly use the X-ray reflectivity; our experimental results are compared with those obtained by other techniques. In addition some preliminary surface diffraction experiments are reported here; they show that there is a long range in-plane order in a Newton black film.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/BF01188936

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