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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 55 (1999), S. 119-126 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The basis has been explored for the possible application of the various schemes that have been proposed for making use of the focusing properties of single heavy atoms, or rows of atoms extending through thin crystals in axial directions, for the attainment of ultra-high resolution in electron microscopy. Calculations are reported for the form of 200 keV electron beams channeled along rows of atoms through crystals and propagated in the vacuum beyond the crystals. The conditions for forming beams less than 0.05 nm in diameter have been established. Simulations of images having resolutions of this order are reported for the case that the specimen is placed at the Fourier image position beyond the exit face of a thin crystal and the transmission of the periodic array of ultra-fine beams, translated laterally by tilting the incident beam, may be observable using a conventional transmission-electron-microscopy (TEM) instrument.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 55 (1999), S. 103-104 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 55 (1999), S. 533-542 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The periodic array of very fine cross-overs formed at the exit face of a thin `atomic focuser' crystal, illuminated by a parallel electron beam, may be used to form moiré patterns with a specimen crystal such that the structure of the specimen crystal may be derived with a resolution of better than 0.5 Å. Computer simulations of the moiré pattern formation have been made for the simple idealized case of two parallel gold-like lattices having a 10% difference in lattice constant. Moiré images are shown for the case of a small objective aperture in the viewing electron microscope such that the individual crystal lattices are not resolved and for a larger objective aperture for which the individual crystal lattices are resolved and the intensity is measured at the positions of the atoms of the atomic focuser crystal. The latter case confirms the viability of the scheme for ultra-high-resolution imaging of general specimens by use of a thin-crystal periodic atomic focuser, as previously proposed.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 30 (1995), S. 181-192 
    ISSN: 1059-910X
    Keywords: Electron Ronchigrams ; Numerical reconstruction ; Lens aberrations ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: In a dedicated STEM instrument equipped with a field emission gun, shadow images are easily obtained and have many uses. They are very sensitive to misalignment of the instrument and astigmatism, and therefore can be used for rapid and accurate alignment of the microscope. For crystalline materials, the shadow image contains both the bright-field and dark-field images. It is a summation of the transmitted and diffracted beams, and is basically a kind of Gabor's in-line hologram. Under small or medium defocus, shadow images of a thin, well-orientated crystalline specimen take the characteristic form of Ronchigrams, which offer a unique means to calibrate the microscope operation parameters, such as the spherical aberration coefficient Cs and defocus settings of the objective lens, with high accuracy. With the calibrated values of Cs and δ, a transfer function of the objective lens may be generated. In the stage of numerical reconstruction, by adapting this transfer function to the experimentally recorded hologram the lens aberration introduced in forming the hologram may be corrected and an improved resolution may be achieved for electron microscope images. © 1995 Wiley-Liss, Inc.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
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