Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
69 (1998), S. 1446-1450
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We present a new Brewster angle microscope for the study of very thin layers as thin as monolayers, using a custom-made objective. This objective avoids the drawbacks of the models existing at the present time. Its optical axis is perpendicular to the studied layer and consequently gives an image in focus in all the plane contrary to the existing models which give images in focus along a narrow strip. The objective allows one to obtain images with a good resolution (less than 1 μm) without scanning the surface, at the video frequency, allowing for dynamic studies. A large frontal distance associated with a very large aperture is obtained by using a large lens at the entrance of the objective. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1148779
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