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  • 1995-1999  (2)
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4180-4187 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Major parts of our proven calibration facility have been totally renewed and other equipment has been added to fulfill the actual requirements for efficient calibration of modern space ion mass spectrometers. The main change was the replacement of the old two axes turntable by a new four axes turntable that can be used in a wide range with high precision. An additional effort has been made to design and test a new expansion system with higher transmission and improved quality with respect to overall homogeneity, parallel trajectories, and angular divergence of the ion beam. A personal computer is used to survey the state of the whole vacuum system permanently and to vent, pump down, and bakeout the calibration chamber automatically. A main computer has been installed which controls the turntable, the ion beam, the beam diagnostics, experimental high voltages, and the data acquisition with our detectors. A general interface allows the full control of the whole system for the complete automated calibration of a flight instrument. As an example, the calibration of the toroidal imaging mass-angle spectrograph instrument for the POLAR mission is described. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A novel misalignment offset reduction technique is extended in order to separate a piezoresistive voltage, from the Hall voltage, in doubly connected Hall elements based on silicon. In a special configuration, this method exploits directional averaging using biaxial current injection from four electrically separate current sources in order to cancel in situ the stress-generated off-diagonal piezoresistive voltage across the Hall voltage contacts. Measurements suggest field-equivalent offsets below 1 mT in (001) surface n-Si devices with current injection in the [110] direction. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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