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  • 1995-1999  (3)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 1631-1639 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A source of highly dissociated, intense, cold hydrogen and deuterium atomic beams to be used as a dissociator in polarized gas targets for storage ring experiments has been developed. This dissociator is based on a plasma source which couples a 2.45 GHz surface wave to the discharge. At the end of the discharge tube a cold atomic beam is formed by means of a cooled nozzle. The entire system has been optimized to obtain a beam with a high atomic fraction and long-term stable reproducible operation. We measured a high degree of dissociation of more than 70% at gas throughputs up to 3 mbar l/s for both hydrogen and deuterium, corresponding to an atomic flow rate of 1.2×1020 s−1. Excellent long-term stability has been achieved. We also studied quantitatively the effect of recombination of atoms on the nozzle surface for various materials. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 2909-2911 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate that highly efficient single-layer light emitting devices (LED) can be realized by better control in the device production process, especially regarding the interface between the active material and the metal cathode. The device cross-section was investigated using Auger depth profiling and spectroscopy. Following this approach, LEDs with para-sexiphenyl (optical gap: 3.1 eV) as active medium and aluminum as cathode were realized, which emit blue light at a bias of only 3.5 V, when the aluminum deposition rate is drastically reduced, namely from 10 to below 1 Å/s. We find that the lower deposition rate of Al results in a decreased width of the interfacial region, where carbon, aluminum, and oxygen are intermixed. At the same time the relative oxygen concentration at the cathode interface is increased. However, the presence of oxygen does not lead to the formation of oxidized aluminum species, as verified by the Al local mixing model (LMM) Auger signal. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1432-0711
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Type of Medium: Electronic Resource
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