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  • 1995-1999  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 2550-2552 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: During the early stages of oxidation of (111) NiAl at 1100 °C, an alumina scale forms and undergoes a series of allotropic phase transformations. In the final stages of phase development, the metastable aitch-theta-alumina transforms to the equilibrium α-alumina phase. Images formed using the photoluminescence from trace Cr3+ impurities in the scale, in conjunction with scanning electron microscopy, indicate that the α-alumina forms by a nucleation and growth process within the aitch-theta-alumina matrix. Lateral impingement of the growing α-alumina islands coincides with the reported drop in oxidation kinetics to those characteristic of long-term oxidation of NiAl. Unlike most interface-controlled transformations, the kinetics of the θ–to–α transformation in the lateral growth are found to be logarithmic. Possible causes of these unusual kinetics are proposed. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 3754-3756 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The stresses in the aluminum oxide formed during high-temperature oxidation of a bond-coated superalloy are shown to be measurable through zirconia thermal barrier coatings. The basis for the measurements is the piezospectroscopic shift in the R-line fluorescence (photoluminescence) from Cr3+ impurities incorporated into the growing aluminum oxide scale. Measurements through the thermal barrier coating are feasible because (partially stabilized) zirconia coatings have some transparency at both the excitation and at fluorescence frequencies. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Oxidation of metals 45 (1996), S. 267-280 
    ISSN: 1573-4889
    Keywords: oxidation stresses ; piezospectroscopy ; fluorescence ; alumina
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The alumina scales on a variety of high-temperature alloys are found to fluoresce when illuminated with light having a frequency greater than 18,000 cm−1. The fluorescence exhibits two narrow lines characteristic of chromium-doped alpha-aluminum oxide. The frequency shift of the two lines from the room-temperature, stress-free values of 14,402 cm−1 (1.786 eV) and 14432 cm−1 (1.789 eV) provides a noncontact measure of the stress in the alumina scales using the piezospectroscopic effect. In addition, the broadening of the lines is a measure of the stress gradient in the scale. The physical basis for the fluorescence technique is described together with its implementation for highspatial-resolution (∼2 μm) measurements. As illustration, room-temperature measurements of the residual stress in scales formed at 1100°C on single-crystal NiAl, polycrystalline Ni3Al, two Fe−Ni−Cr−Al alloys, and two Ni−Al base superalloys are presented.
    Type of Medium: Electronic Resource
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