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  • 1
    Electronic Resource
    Electronic Resource
    Dual toroidal photoelectron spectrometer for investigating photodouble ionization in atoms and molecules (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 2685-2692 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A photoelectron-photoelectron coincidence spectrometer, incorporating two independent toroidal analyzers, has been developed to study photodouble ionization of gas targets using synchrotron radiation. The energy-resolved and angle-dispersed electron images are recorded using two-dimensional position-sensitive detectors. The design and performance of the spectrometer is described, with particular emphasis on the electron optical properties of toroidal deflectors and their associated electrostatic lenses. The operation and calibration of the spectrometer are discussed and sample (γ,2e) results of helium are presented. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148180
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Surface characterization of PVP-sized and oxygen plasma-treated carbon fibers (1998)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 39-55 
    Details
    ISSN: 0142-2421
    Keywords: carbon fiber ; plasma surface treatment ; sizing ; atomic force microscopy ; x-ray photoelectron spectroscopy ; XPS ; AFM ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The objectives of this work were to characterize the surface of commercial carbon fibers, focusing on the effect of polymer sizing and the effect of oxygen radiofrequency plasma treatment. The fiber surface composition was determined by x-ray photoelectron spectroscopy (XPS) and the surface topography was examined by scanning transmission electron microscopy (STEM) and atomic force microscopy (AFM).Voltage-contrast XPS distinguished between unsized and sized carbon fibers, by which the former behaved as a conductive material whereas the latter behaved as a mixture of both conductive and non-conductive materials due to a contribution from a polymeric sizing material. The AFM measurements revealed that oxygen plasma treatment for 30 s roughened the unsized fiber surfaces; however, further treatment smoothed the overall topography. Oxygen plasma treatment for 30 s also increased the surface oxygen content. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 17 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
  • 3
    Electronic Resource
    Electronic Resource
    Interdiffusion at the interface between poly(vinylpyrrolidone) and epoxy (1997)
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 35 (1997), S. 331-346 
    Details
    ISSN: 0887-6266
    Keywords: interdiffusion ; interface/phase ; electron microprobe analysis ; epoxy ; thermoplastic polymer ; a cure reaction ; Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Electron microprobe analysis (EMP) was used to study interdiffusion in bilayer films of thermoplastic poly(vinylpyrrolidone) (PVP) and a thermoset epoxy. The bilayer films were prepared by casting a stoichiometric mixture of the uncured diglycidyl ether of bisphenol A epoxy (DGEBA) and 4,4′-diaminodiphenylsulfone (DDS) on the PVP film and then curing the system in a two-step process under a nitrogen atmosphere. For the EMP studies, the sulfur signal was used as a probe for DDS, while the nitrogen signal served as a probe for both DDS and PVP. The addition of brominated DGEBA to the conventional DGEBA in a 1: 1 weight ratio allowed the bromine signal to be used as a probe for the epoxy phase. It was found that the interfacial thickness was much larger for the film prepared from low molecular weight PVP than that from high molecular weight PVP. Interdiffusion was suppressed when the initial cure temperature in the two-step cure cycle was 130°C compared to 170°C, in which the first stage of the cure reaction dominated the interdiffusion process. More importantly, it was demonstrated that the diffusion front of the curing agent was located closer to the thermoplastic polymer phase as compared to that of the thermoset polymer in the interface region. This tendency was more significant in the system with the larger interfacial thickness. These results have important consequences on interphase structures and properties. They suggest that crosslinking of the epoxy in the interphase may be suppressed because of an insufficient amount of curing agent and that the not-fully-reacted curing agent in the PVP phase may act to plasticize this phase. © 1997 John Wiley & Sons, Inc.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
  • 4
    Electronic Resource
    Electronic Resource
    Determination of the concentration of surface hydroxyl groups on metal oxide films by a quantitative XPS method (1998)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 549-564 
    Details
    ISSN: 0142-2421
    Keywords: XPS ; x-ray photoelectron spectroscopy ; angle-resolved ; Al ; hydroxyl ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Quantitative XPS has been used to determine the surface concentration of hydroxyl groups in native air-formed oxide films on metals having low surface areas. A mathematical expression has been derived to give the concentration of surface hydroxyl groups as a function of the intensity ratio of the OH to O2- contributions to the O 1s photopeak. This expression is based on modeling the oxide film on a metal to be a multilayer system consisting of an outermost layer of organic contamination, a layer of chemisorbed water, a surface hydroxylated region of the oxide film and the inner portion of the oxide film. The average values of the experimentally determined concentrations of surface hydroxyl groups are 15, 13, 11, 6 and 8 OH nm-2 for oxide-covered aluminum, chromium, titanium, tantalum and silicon, respectively. X-ray photoelectron spectroscopy depth profiles using argon ion sputtering and variable-angle XPS have been utilized in this work. Surface treatments have employed either ultrasonic cleaning with organic solvents or argon plasma treatment. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 15 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
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