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  • 1995-1999  (2)
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Material
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Year
  • 1
    Electronic Resource
    Electronic Resource
    Current density and ac field effects on 1/f noise in spin valve sensors (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 4469-4470 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Low frequency noise in patterned NiFe/Co/Cu/Co/FeMn (ΔR/R〉9%) spin valves was investigated. The spin valves were sputter deposited and patterned by lift-off to form 75 μm×1000 μm lines. Noise power spectra were measured in the frequency range from 1 Hz to 10 kHz for ac and dc fields applied both parallel and perpendicular to the easy axis. An increase in the low frequency noise power spectrum was observed for an ac field applied along the easy axis. Increasing the ac drive frequency from 500 Hz to 5 kHz reduced the low frequency noise power to near the zero field background level. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370377
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Tunneling induced charge generation in SiO2 thin films (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 3898-3905 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Charge buildup in thermally grown SiO2 thin films due to Fowler–Nordheim tunneling has been investigated. Both positive and negative oxide charge can be generated by the tunneling current. The stress fluence, voltage amplitude, and polarity dependence of the positive charge generation points to impact ionization occurring near the oxide substrate interface as the most likely source of this charge. The centroid location and density of the negative oxide charge are used to analyze the negative charge generation process at different stress voltage levels and temperature. A theoretical model is proposed and compared with the experimental data. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.366624
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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