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  • 1
    ISSN: 1520-5835
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 759 (1995), S. 0 
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 2288-2297 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Based on the analysis of the micro-processes due to the interaction of synchrotron radiation with materials, we have developed a theoretical method to calculate the heat energy deposited when synchrotron radiation passes through insert devices (filters, mirrors or monochromators). The micro-processes are photoionization, Compton scattering, Rayleigh scattering, electron elastic and inelastic collisions, electron Bremsstrahlung scattering and the Auger process. The energy of x rays is converted into the electrons' kinetic energy and atomic excitation energy by photoionization and Compton scattering. High-energy photoelectrons slow down mainly through inelastic collisions with the atoms in materials. The energy deposition in a material is simulated according to the x-ray atom interaction cross sections and photoelectron-atom collision cross sections. The results of a calculation for x rays traversing Si and Be plates of 1.0 cm in thickness are presented and discussed as one typical example concerning important materials in optical devices. The dependence of the energy deposition on the angle of incidence of the x rays is also discussed. Both the utility and validity of the present simulation method are discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An experiment was performed on beamline BL 3 at the European Synchrotron Radiation Facility to test the diffraction performance of a novel internally liquid-nitrogen-cooled, thin silicon crystal monochromator exposed to high heat loads. The beam parameters were chosen to closely match the conditions expected, in terms of absorbed power and beam profile, at the Advanced Photon Source (APS) for the closed gap undulator at 7 GeV and 100 mA. The cooled crystal was oriented at 11.4° in the symmetric Bragg geometry to diffract 30 keV x-rays from the Si(333) planes. The source was a 44-pole wiggler with the insertion device gap set at 25.0 mm corresponding to a deflection parameter, K, of 4.2. A tunable toroidal mirror was used to focus the wiggler beam onto the crystal. Double-crystal rocking curves were measured at several power values using different attenuators. The maximum total power absorbed by the 0.6-mm-thick crystal was 154 W at a storage ring current of 136 mA. The peak power density at normal incidence was about 420 W/mm2 corresponding to an absorbed peak power density on the crystal face of 83 W/mm2. No thermal-induced broadening of the rocking curve was observed above the average measured mounting/fabrication strain of 2 arcsec. Rocking curves were also measured as a function of coolant flow rate and pressure. No systematic broadening occurred due to flow-induced vibrations up to 6 l/min. It has been demonstrated that thin silicon crystals directly cooled with liquid nitrogen can handle high power density synchrotron beams comparable to what is expected for the APS undulators with no appreciable thermal deformation. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An elliptic multipole wiggler beamline will be constructed for inelastic scattering (Compton scattering) experiments at the SPring-8. This beamline will provide monochromatic x rays with linear or elliptic polarization in the energy range of 100–300 keV. It will extend the application of the Compton scattering experiments to the study of materials science. An outline of the beamline is given. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A newly designed, cryogenically cooled, thin Si crystal monochromator was tested at the European Synchrotron Radiation Facility (ESRF) beamline BL3. It exhibited less than 1 arcsec of thermal strain up to a maximum incident power of 186 W and average power density of 521 W/mm2. Data were collected for the thin (0.7 mm) portion of the crystal and for the thick ((approximately-greater-than)25 mm) part. Rocking curves were measured as a function of incident power. With a low power beam, the Si(333) rocking curve at 30 keV for the thin and thick sections was 〈1 arcsec FWHM at room temperature. The rocking curve of the thin section increased to 2.0 arcsec when cooled to 78 K, while the thick part was unaffected by the reduction in temperature. The rocking curve of the thin section broadened to 2.5 arcsec FWHM and that of the thick section broadened to 1.7 arcsec at the highest incident power. The proven range of performance for this monochromator has been extended to the power density, but not the absorbed power, expected for the Advanced Photon Source (APS) undulator A in closed-gap operation (first harmonic at 3.27 keV) at a storage-ring current of 300 mA. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 1058-1060 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Photon–ion merged-beam apparatus using a compact ECR ion source and a high-brilliance light source has been designed for the study of photoabsorption processes of multiply charged ions. Photoion spectroscopy will be performed along isoelectronic, isonuclear and isoionic sequences. The main features of this apparatus are described.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 673-675 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The design and performance of a new water-cooled and doubly bent crystal monochromator for Compton scattering experiments are described. Its mechanical system is similar to that of a usual bent cylindrical X-ray mirror. A monolithic Si (111) crystal is mounted on a water-cooled and cylindrically polished copper crystal holder with liquid Ga–In alloy between them in order to obtain good thermal and mechanical contact. The sagittal bending radius of the holder, Rs, is 508 mm. The holder is mounted on a mechanical bender making a meridian radius, Rm, of 596 m. The performance of the monochromator, which has been installed at the Photon Factory Accumulator Ring beamline NE1, is as follows. The focused beam size, flux and energy resolution for 60 keV X-rays are 0.5 mm in height and 2.0 mm in width, 5 × 1012 photons s−1 and about 60 eV, respectively. The new monochromator gives one order higher brightness at the sample position and also better energy resolution than the previous monochromator. The overall momentum resolution for high-resolution Compton scattering experiments becomes 0.08 atomic units, and the background can be reduced by a third, because it is possible to insert a fine slit after the analyser crystal without losing any Compton scattering signal.
    Type of Medium: Electronic Resource
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  • 9
    ISSN: 1435-1536
    Keywords: Colloidal crystals ; silica spheres ; electrical double layer ; single crystals
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Colloidal single crystals of silica spheres (103 nm in diameter) are formed in the presence of various kinds of salts 1 simple electrolytes, i.e., sodium chloride, calcium chloride and lanthanum chloride, 2 polyelectrolytes such as 3–6 type ionen polymer (polybrene), poly-N-ethylpyridinium bromide, a copolymer ofN-benzyl pyridinium chloride andN-hexadecyl pyridinium bromide, and sodium polyethylene sulfonate, and 3 cationic and anionic detergents, hexadecyltrimethylammonium bromide and sodium dodecylsulfate. Shape and size of their single crystals, phase diagram, and the relationship between the two parameters among the critical concentration of melting, conductance and pH of the crystal-like suspensions have been studied. Colloidal single crystals ofpositively charged spheres have been formed in this study by the method of the charge reversal of spheres through the strong adsorption of cationic polyelectrolytes onto the anionic silica spheres.
    Type of Medium: Electronic Resource
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  • 10
    ISSN: 1435-1536
    Keywords: Key words Evanescent wave ; dynamic light scattering ; particle-wall interaction ; colloidal particle ; time-correlation function
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract  The diffusion behavior of polymer latex particles in dispersion near the quartz interface has been estimated by evanescent wave dynamic light scattering (EVDLS) technique. The diffusion coefficient of the particles was measured as a function of the distance between the particle and interface. The apparent diffusion coefficient estimated by EVDLS was small for particles near the interface and increased upon increasing the distance from the interface, and then saturated at a certain value which is close to the value expected for free-motion. The range of the distance over which diffusion was affected by interaction with the interface depended on the added salt concentration. This means that the diffusion of the particle is influenced by an electrostatic interaction between the particle and quartz interface in addition to the hydrodynamic effect near the wall. This range was found to be more than 800 nm at 0 M salt condition but about 400 nm at 10-4 and 10-3 M salt conditions. Hence it is appropriate to say that the hydrodynamic effect reaches up to 400 nm and the electrostatic effect is longer ranged, more than 800 nm, for the system studied here. The EVDLS technique is a very powerful tool for quantitative estimations of the dynamic behavior of the particle near the interface and for estimation of the range where the wall effect is dominant. EVDLS will give us an answer to the question of “where is the ‘interface’ and where is the ‘bulk’?”.
    Type of Medium: Electronic Resource
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