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  • 1995-1999  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 6 (1999), S. 435-443 
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Based on the fluctuation-dissipation theorem, this work is concerned with the dynamic form factor of Thomson scattering for ion-collisional plasmas. The main effort is to calculate the ion susceptibility by analytically solving the linearized ion Fokker–Planck equation through the Chang–Callen 13-moment approach. Comparison to other theories shows that this theory can provide an accurate prediction of the position and width for ion-acoustic peaks and a proper description of the entropy wave with some underestimation of its damping. The theory may be useful for explaining experimental data and making measurement more precise. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 4 (1997), S. 2736-2740 
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dynamic form factor for Thomson scattering with a non-Maxwellian (super-Gaussian) electron velocity distribution is analytically and numerically studied for the first time. Both the ion and electron features of the spectra for α〉1 are found to be affected strongly. For the ion feature, the use of the usual theoretical spectra with the assumption of a Maxwellian distribution for fitting the measured Thomson scattering spectra may have resulted in some errors in calculating the plasma parameters in high-Z plasmas irradiated with high intensity light. However, it is impossible to use the ion feature of the measured spectra alone to deduce the form of the electron distribution. For the electron feature, the spectral shape (in particular the peak amplitude) changes sensitively with the distribution index. It would be possible to detect the super-Gaussian distribution by simultaneously measuring the ion and electron features of the spectra. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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