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  • 1995-1999  (1)
  • 1990-1994  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 7018-7021 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Polycrystalline β-SiC samples were implanted with 50 keV 15N ions with fluences ranging from 3×1017 to 1.5×1018 ions/cm2 at elevated temperature up to 1100 °C. Nitrogen depth profiles were measured as a function of implantation temperature and annealing temperature using nuclear reaction analysis, Rutherford backscattering spectroscopy, and Auger electron spectroscopy. It was found that the maximum concentration and the width of nitrogen depth profiles implanted at 1100 °C were reduced distinctly in comparison with the profiles implanted below 930 °C or annealed at 1100 °C. The redistribution of nitrogen implanted in SiC at 1100 °C was ascribed to the formation of β-Si3N4 crystallites in SiC, which was confirmed by x-ray diffraction at glancing incidence. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 26 (1993), S. 207-209 
    ISSN: 1434-6079
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The structure of silica acrogel, a porous low density material having small particle size prepared from TMOS has been investigated by DSC, SAXS, and Raman spectroscopy. The predominant particle size of the aerogel were determined to be near 3 nm by SAXS analysis. The Raman spectra are qualitatively similar to those from fused silica, although the sample before heat treatment had typical Raman peaks assigned to organic groups contained in TMOS. The observed relatively intense peaks at near 490 and 606 cm−1 suggest the existence of small rings, e.g., six(3-SiO) or eight(4-SiO) membered, in the aerogel. The structure change of the aerogel with temperature was also studied by Raman spectroscopy.
    Type of Medium: Electronic Resource
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