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  • 1990-1994  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 1187-1195 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Monte Carlo simulations of cascade processes of secondary electron generation in Si, Cu, and Au have been performed to study the energy distribution of backscattered electrons in the low-energy region. Calculation results show that the characteristic hump appearing in the energy distribution above Si-LVV Auger peak in the EN(E) spectrum can be well described by those electrons ejected from the L shell followed by the cascade process. The shape of EN(E) spectra in the low-energy region is dominated by the directly produced secondary electrons and, hence, strongly correlated with the excitation spectrum Im[−1/ε(ω)] for electron generation.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7180-7187 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Monte Carlo simulation code has been developed to describe the x-ray generation in a specimen for electron probe microanalysis (EPMA), enabling x-ray spectra observed by EPMA to be reproduced theoretically. The Monte Carlo simulation is based on the use of the Mott cross section and Bethe stopping power equation in describing elastic and inelastic scattering processes, respectively. With respect to x-ray generation the Sommerfeld theory for bremsstrahlung radiation was described by equations of Kirkpatrick–Wiedmann and of Statham for bremsstrahlung cross section. The up-to-date compilation of mass absorption coefficient by Henke, Gullikson, and Davis [At. Data Nucl. Data Tables 54, 181 (1993)] is used to evaluate attenuation of x-ray intensity. To verify the present Monte Carlo simulation measurements of x-ray spectra for Cu and Rh targets have been performed for primary electron energies of 10–30 keV by energy-dispersive x-ray spectrometry of an electron probe microanalyzer. Excellent agreement between experimental spectra and calculated results has been confirmed in the cases investigated, leading to the conclusion that the Monte Carlo simulation technique will be a powerful tool for more comprehensive understanding of x-ray generation in EPMA specimens. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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