ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A novel synchronous real-time analog sampling method for obtaining the sum and difference interferograms in double modulation Fourier transform infrared absorption experiments is described, and the application of this sampling methodology to polarization-modulation FTIR measurements of thin films at metal surfaces is demonstrated. A quadratic approximation of the background signal is used to calculate the difference interferogram. The demodulation of a test waveform with the real-time sampling electronics reveals how the bandwidth limitations of previous double modulation experiments on FTIR interferometers that employed lock-in amplifiers have been eliminated.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142462
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